Patents by Inventor Alberto Castro
Alberto Castro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12296533Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: February 13, 2024Date of Patent: May 13, 2025Assignee: Divergent Technologies, Inc.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Patent number: 12292384Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: GrantFiled: May 10, 2024Date of Patent: May 6, 2025Assignee: Divergent Technologies, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Publication number: 20240326326Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: ApplicationFiled: February 13, 2024Publication date: October 3, 2024Applicant: Divergent Technologies, Inc.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20240302286Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: ApplicationFiled: May 10, 2024Publication date: September 12, 2024Applicant: DIVERGENT TECHNOLOGIES, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 12019026Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: GrantFiled: April 19, 2023Date of Patent: June 25, 2024Assignee: DIVERGENT TECHNOLOGIES, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 11931956Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: September 13, 2022Date of Patent: March 19, 2024Assignee: DIVERGENT TECHNOLOGIES, INC.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20240085336Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: ApplicationFiled: April 19, 2023Publication date: March 14, 2024Applicant: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 11692876Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: GrantFiled: July 9, 2021Date of Patent: July 4, 2023Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Patent number: 11674904Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: GrantFiled: June 29, 2020Date of Patent: June 13, 2023Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Publication number: 20230081180Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: ApplicationFiled: September 13, 2022Publication date: March 16, 2023Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Patent number: 11478854Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: August 7, 2020Date of Patent: October 25, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20210404886Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: ApplicationFiled: July 9, 2021Publication date: December 30, 2021Applicant: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Patent number: 11073431Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: GrantFiled: November 8, 2019Date of Patent: July 27, 2021Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Publication number: 20210060647Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: ApplicationFiled: August 7, 2020Publication date: March 4, 2021Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20200398550Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: ApplicationFiled: June 29, 2020Publication date: December 24, 2020Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 10786948Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: November 18, 2015Date of Patent: September 29, 2020Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20200249099Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: ApplicationFiled: November 8, 2019Publication date: August 6, 2020Applicant: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Patent number: 10717264Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: GrantFiled: December 27, 2018Date of Patent: July 21, 2020Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 10520372Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: GrantFiled: June 7, 2019Date of Patent: December 31, 2019Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Publication number: 20190323903Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: ApplicationFiled: June 7, 2019Publication date: October 24, 2019Applicant: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro