Patents by Inventor Alberto M. Castro

Alberto M. Castro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210138578
    Abstract: An additive manufacturing system comprises a build plane and an energy source configured to direct energy onto a work region of the build plane. An optical detector is configured to receive one or more optical signals from the work region. An optical filter is positioned between the work region and the optical detector, wherein the optical filter includes a first partially transmissive polarized filter having a first polarization axis and a second partially transmissive polarized filter having a second polarization axis. The first polarization axis is rotationally offset from the second polarization axis approximately 90 degrees. The optical filter improves the signal to noise ratio of the optical sensors.
    Type: Application
    Filed: November 6, 2020
    Publication date: May 13, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Darren Beckett, Martin S. Piltch, Scott Betts, Alberto M. Castro, Kevin Anderson, Lars Jacquemetton, Luis Aguilar
  • Publication number: 20210046546
    Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
    Type: Application
    Filed: August 26, 2020
    Publication date: February 18, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Mark J. Cola, Scott Betts, Darren Beckett, Alberto M. Castro, Lars Jacquemetton, Martin Piltch
  • Patent number: 10786850
    Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Mark J. Cola, Scott Betts, Darren Beckett, Alberto M. Castro, Lars Jacquemetton, Martin Piltch
  • Publication number: 20200290154
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: March 26, 2020
    Publication date: September 17, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Patent number: 10639745
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: May 5, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20200101671
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: September 18, 2019
    Publication date: April 2, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Patent number: 10479020
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: November 19, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20190255654
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20190255614
    Abstract: This disclosure describes an additive manufacturing system that includes a build plane having a first region and a second region. Multiple energy source can be positioned above the build plane and configured to direct energy into the first and second regions of the build plane. The system includes optical sensors configured to monitor an intensity of light emitted from the energy sources. A processor associated with the additive manufacturing system is configured to adjust the sensor outputs in response to the energy sources coming into close proximity.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Mark J. Cola, Scott Betts, Darren Beckett, Alberto M. Castro, Lars Jacquemetton, Martin Piltch
  • Publication number: 20190039318
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: August 1, 2018
    Publication date: February 7, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro