Patents by Inventor Albertus Beumer

Albertus Beumer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9383326
    Abstract: A technique, including associated method and system, for on-line measurement of a trace element in a crude or heavy fuel stream for a refinery, including in one embodiment: providing at least one x-ray fluorescence (“XRF”) analyzer at a point for the refinery; analyzing the petroleum stream for chlorine using the analyzer; and providing results from the analyzer to refinery operators, to improve refinery operations. The analyzer may be a monochromatic wavelength XRF analyzer, wherein the analyzer focuses energy to/from the stream using an x-ray engine having at least one focusing, monochromating x-ray optic. The analyzer may be an MWDXRF or ME-EDXRF analyzer; and the trace element may be one or more of the following elements: S, Cl, P, K, Ca, V, Mn, Fe, Co, Ni, Cu, Zn, Hg, As, Pb, and Se; and in one embodiment the stream is crude, and the trace element is chlorine.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: July 5, 2016
    Assignee: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Albertus Beumer, Zewu Chen
  • Publication number: 20140198898
    Abstract: A technique, including associated method and system, for on-line measurement of a trace element in a crude or heavy fuel stream for a refinery, including in one embodiment: providing at least one x-ray fluorescence (“XRF”) analyzer at a point for the refinery; analyzing the petroleum stream for chlorine using the analyzer; and providing results from the analyzer to refinery operators, to improve refinery operations. The analyzer may be a monochromatic wavelength XRF analyzer, wherein the analyzer focuses energy to/from the stream using an x-ray engine having at least one focusing, monochromating x-ray optic. The analyzer may be an MWDXRF or ME-EDXRF analyzer; and the trace element may be one or more of the following elements: S, Cl, P, K, Ca, V, Mn, Fe, Co, Ni, Cu, Zn, Hg, As, Pb, and Se; and in one embodiment the stream is crude, and the trace element is chlorine.
    Type: Application
    Filed: June 14, 2012
    Publication date: July 17, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Albertus Beumer, Zewu Chen