Patents by Inventor Aldegonda C. M. Van Asten

Aldegonda C. M. Van Asten has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6084940
    Abstract: An X-ray examination apparatus according to the present invention includes an X-ray detector for deriving an image signal from an X-ray image, and an exposure control system for adjustment of the X-ray examination apparatus on the basis of a relevant part of the X-ray image. The exposure control system is arranged to group pixels of the X-ray image in one or more clusters on the basis of their brightness values and to select the relevant part of the X-ray image from the clusters.
    Type: Grant
    Filed: April 16, 1998
    Date of Patent: July 4, 2000
    Assignee: U.S. Philips Corporation
    Inventor: Aldegonda C. M. Van Asten