Patents by Inventor Aldo Martinazzo

Aldo Martinazzo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7681086
    Abstract: A method for Fault Tree Map generation employs to transformation of Fault Trees of production installation, specific installation, technical system (Hardware and integrated Hardware/Software) to new Fault Tree diagram (Fault Tree Map), which permits drastically compact the Fault Tree depiction and facilitates performing of the Fault Tree qualitative analysis, including evaluation of combination of latent failures and evident failures, repeated events and critical events position influence, and failure propagation potentiality, besides facility of localization of each Fault Tree logical Gate and relevant failures in the fault tree printed report. Generation takes place using special symbols, which permit to reflect the Fault Tree logic, present all Fault Tree failures with graphically identification of the failure type, and show the failure repetition and also the failure critically (importance) to Fault Tree Top Event probability.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: March 16, 2010
    Assignee: Embraer- Empresa Brasileira de Aeronautica S.A.
    Inventors: Olga Alexandrovna Vlassova, Antonio Bakowski, Jaures Cardoso, Jr., Aldo Martinazzo
  • Publication number: 20090083576
    Abstract: A method for Fault Tree Map generation employs to transformation of Fault Trees of production installation, specific installation, technical system (Hardware and integrated Hardware/Software) to new Fault Tree diagram (Fault Tree Map), which permits drastically compact the Fault Tree depiction and facilitates performing of the Fault Tree qualitative analysis, including evaluation of combination of latent failures and evident failures, repeated events and critical events position influence, and failure propagation potentiality, besides facility of localization of each Fault Tree logical Gate and relevant failures in the fault tree printed report. Generation takes place using special symbols, which permit to reflect the Fault Tree logic, present all Fault Tree failures with graphically identification of the failure type, and show the failure repetition and also the failure critically (importance) to Fault Tree Top Event probability.
    Type: Application
    Filed: September 20, 2007
    Publication date: March 26, 2009
    Inventors: OLGA ALEXANDROVNA VLASSOVA, Antonio Bakowski, Jaures Cardoso, JR., Aldo Martinazzo