Patents by Inventor Alejandro del Castillo

Alejandro del Castillo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dynamic metadata extraction workflow for measurement data storage
    Patent number: 11321341
    Abstract: A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.
    Type: Grant
    Filed: May 15, 2020
    Date of Patent: May 3, 2022
    Assignee: National Instruments Corporation
    Inventors: Sundeep Chandhoke, Michael S. Watson, Alejandro del Castillo, Daren K. Wilson
  • DYNAMIC METADATA EXTRACTION WORKFLOW FOR MEASUREMENT DATA STORAGE
    Publication number: 20210357421
    Abstract: A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.
    Type: Application
    Filed: May 15, 2020
    Publication date: November 18, 2021
    Inventors: Sundeep Chandhoke, Michael Watson, Alejandro del Castillo, Daren K. Wilson