Patents by Inventor Alejandro Jose Martinez Abietar

Alejandro Jose Martinez Abietar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9200997
    Abstract: This invention describes a photonic sensing method and device based on the periodic dielectric structures of photonic forbidden band, in which the sensing process is carried out through the measurement of variation in signal amplitude as it exits the device. The variation in amplitude is due to a variation in the refraction index of the structure, as a consequence of the presence of the substances that are the object of the sensing. Among the advantages provided by the invention, it is worth mentioning its simplicity in the sensing process; its high level of integration, allowing for a design of reduced proportions; and its adaptability to dielectric structures of one, two or three dimensions.
    Type: Grant
    Filed: July 21, 2010
    Date of Patent: December 1, 2015
    Assignee: UNIVERSIDAD POLITECNICA DE VALENCIA CTT, CENTRO DE TRANSFERENCIA DE TECNOLOGIA
    Inventors: Jaime Garcia Ruperez, Javier Marti Sendra, Alejandro Jose Martinez Abietar
  • Patent number: 8413908
    Abstract: The invention relates to an optical security mark that can be applied to an object, said mark comprising a structure made of a metamaterial that generates a magnetic response to incident radiation having a wavelength (?) corresponding to a specific code of formula ?r(?) where ?r is the relative magnetic permeability of the metamaterial and ? is a wavelength of the incident radiation having a value of between 15 nm and 1100 nm, or a specific code of formula ?(?r) or combinations of said codes. Said mark has a first tranverse dimension bx in a first transverse extension of the metamaterial and a second transverse dimension by in a second transverse extension of the metamaterial, different from the first transversal dimension, the first transverse dimension and the second transverse dimension each being at least equal to the wavelength (?) of the incident radiation.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: April 9, 2013
    Assignee: Universitat Politecnica de Valencia
    Inventors: Alejandro Jose Martinez Abietar, Carlos Garcia Meca, Javier Marti Sendra
  • Publication number: 20120170041
    Abstract: This invention describes a photonic sensing method and device based on the periodic dielectric structures of photonic forbidden band, in which the sensing process is carried out through the measurement of variation in signal amplitude as it exits the device. The variation in amplitude is due to a variation in the refraction index of the structure, as a consequence of the presence of the substances that are the object of the sensing. Among the advantages provided by the invention, it is worth mentioning its simplicity in the sensing process; its high level of integration, allowing for a design of reduced proportions; and its adaptability to dielectric structures of one, two or three dimensions.
    Type: Application
    Filed: July 21, 2010
    Publication date: July 5, 2012
    Applicant: UNIVERSIDAD POLITECNICA DE VALENCIA
    Inventors: Jaime Garcia Ruperez, Javier Marti Sendra, Alejandro Jose Martinez Abietar
  • Publication number: 20120018509
    Abstract: The invention relates to an optical security mark that can be applied to an object, said mark comprising a structure made of a metamaterial that generates a magnetic response to incident radiation having a wavelength (?) corresponding to a specific code of formula ?r(?) where ?r is the relative magnetic permeability of the metamaterial and ? is a wavelength of the incident radiation having a value of between 15 nm and 1100 nm, or a specific code of formula ?(?r) or combinations of said codes. Said mark has a first tranverse dimension bx in a first transverse extension of the metamaterial and a second transverse dimension by in a second transverse extension of the metamaterial, different from the first transversal dimension, the first transverse dimension and the second transverse dimension each being at least equal to the wavelength (?) of the incident radiation.
    Type: Application
    Filed: March 26, 2010
    Publication date: January 26, 2012
    Applicant: UNIVERSIDAD POLITECNICA DE VALENCIA
    Inventors: Alejandro Jose Martinez Abietar, Carlos Garcia Meca, Javier Marti Sendra