Abstract: A memory authentication system initiates various memory operations on a memory chip and then assesses the performance of the memory chip in performing such operations in an attempt to identify a signature in the chip's performance that can be used to identify the chip's source. As an example, a partial erase operation may be performed on programmed memory cells in order to drain some charge from the cells but allowing some charge to remain in the cells. Due to process variations during manufacturing, charge should drain from the cells at different rates such that some of the cells may flip to an erase state while other cells remain in a program state. The pattern of bit flips defines a unique signature that may be used to identify the chip's manufacturing source (e.g., the foundry at which the chip was manufactured).

Abstract: A system for improving radiation tolerance of memory senses an amount of radiation exposure and, based on the sensed amount of radiation exposure, determines whether to perform one or more techniques for mitigating the effects of the radiation exposure. As an example, the system may perform a data refresh operation by re-writing data that has been corrupted by radiation, or the system may adjust the reference voltage used to read memory cells. In another example, the system may perform a fault repair operation by re-programming cells that have erroneously transitioned from a program state to an erase state. The system may selectively perform different radiation-mitigation techniques in a tiered approach based on the sensed amount of radiation in order to limit the adverse effects of the more invasive techniques.

Abstract: A system for improving radiation tolerance of memory senses an amount of radiation exposure and, based on the sensed amount of radiation exposure, determines whether to perform one or more techniques for mitigating the effects of the radiation exposure. As an example, the system may perform a data refresh operation by re-writing data that has been corrupted by radiation, or the system may adjust the reference voltage used to read memory cells. In another example, the system may perform a fault repair operation by re-programming cells that have erroneously transitioned from a program state to an erase state. The system may selectively perform different radiation-mitigation techniques in a tiered approach based on the sensed amount of radiation in order to limit the adverse effects of the more invasive techniques.

Abstract: An improved method, apparatus, and computer instructions for compressing trace data. An instruction stream is identified, and in response to identifying the instruction stream, the instruction addresses in the instruction stream are replaced with a stream identifier to form compressed trace data. Data addresses may be related to instructions in the instruction stream to generate a data trace component in the compressed trace data.

Abstract: An improved method, apparatus, and computer instructions for compressing trace data. An instruction stream is identified, and in response to identifying the instruction stream, the instruction addresses in the instruction stream are replaced with a stream identifier to form compressed trace data. Data addresses may be related to instructions in the instruction stream to generate a data trace component in the compressed trace data.