Patents by Inventor Alessandro Olivo

Alessandro Olivo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11779287
    Abstract: A computed tomography method seeking higher resolutions without imposing a dose increase is described. A mask (10) forms a plurality of X-ray beam lets (14) which are passed through a subject (6), and images are captured on X-ray detector (8). The subject (6) is moved with respect to the X-ray detector and mask, including a rotation around a y axis, and a computed tomography image is reconstructed from the plurality of measured datapoints. The beam lets (14) are of small size. FIGS. 4-8 are blurred, FIGS. 10, 11 and 16b contain too small letters/numbers.
    Type: Grant
    Filed: December 12, 2019
    Date of Patent: October 10, 2023
    Assignee: UCL Business Ltd
    Inventors: Charlotte Hagen, Fabio Alessio Vittoria, Marco Endrizzi, Alessandro Olivo
  • Publication number: 20220015720
    Abstract: A computed tomography method seeking higher resolutions without imposing a dose increase is described A mask (10) forms a plurality of X-ray beam lets (14) which are passed through a subject (6), and images are captured on X-ray detector (8). The subject (6) is moved with respect to the X-ray detector and mask, including a rotation around a y axis, and a computed tomography image is reconstructed from the plurality of measured datapoints. The beam lets (14) are of small size. FIGS. 4-8 are blurred, FIGS. 10, 11 and 16b contain too small letters/numbers.
    Type: Application
    Filed: December 12, 2019
    Publication date: January 20, 2022
    Inventors: Charlotte HAGEN, Fabio Alessio VITTORIA, Marco ENDRIZZI, Alessandro OLIVO
  • Patent number: 9952163
    Abstract: A method of X-ray imaging includes passing an X-ray beam through a pre-sample mask 8 with a plurality of apertures 32, through a sample 10, and then through a detector mask 6 with aligned apertures 34. The beams are detected. The detector mask 6 and pre-sample mask 8 are moved with respect to one another to identify the position of maximum intensity and then moved to two further positions on equal and opposite spacings on either side of the maximum. Images are acquired and a transmission image, refraction image and scattering image calculated.
    Type: Grant
    Filed: May 29, 2014
    Date of Patent: April 24, 2018
    Assignee: UCL BUSINESS PLC
    Inventors: Marco Endrizzi, Alessandro Olivo, Paul Diemoz, Thomas Millard, Fabio Vittoria
  • Publication number: 20160146744
    Abstract: A method of X-ray imaging includes passing an X-ray beam through a pre-sample mask 8 with a plurality of apertures 32, through a sample 10, and then through a detector mask 6 with aligned apertures 34. The beams are detected. The detector mask 6 and pre-sample mask 8 are moved with respect to one another to identify the position of maximum intensity and then moved to two further positions on equal and opposite spacings on either side of the maximum. Images are acquired and a transmission image, refraction image and scattering image calculated.
    Type: Application
    Filed: May 29, 2014
    Publication date: May 26, 2016
    Inventors: Marco ENDREZZI, Alessandro OLIVO, Paul DIEMOZ, Thomas MILLARD, Fabio VITTORIA
  • Patent number: 9171650
    Abstract: A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimized and/or aligned with the rows and columns of pixels.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: October 27, 2015
    Assignee: UCL BUSINESS PLC
    Inventors: Konstantin Ignatyev, Alessandro Olivo, Peter Munro, Robert Speller
  • Patent number: 9164045
    Abstract: A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: October 20, 2015
    Assignee: UCL BUSINESS PLC
    Inventors: Peter Munro, Alessandro Olivo, Konstantin Ignatyev, Robert Speller
  • Publication number: 20140233697
    Abstract: A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimised and/or aligned with the rows and columns of pixels.
    Type: Application
    Filed: July 19, 2012
    Publication date: August 21, 2014
    Inventors: Konstantin Ignatyev, Alessandro Olivo, Peter Munro, Robert Speller
  • Publication number: 20140233699
    Abstract: A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
    Type: Application
    Filed: July 19, 2012
    Publication date: August 21, 2014
    Applicant: UCL Business Plc
    Inventors: Peter Munro, Alessandro Olivo, Konstantin Ignatyev, Robert Speller
  • Patent number: 7869567
    Abstract: Phase contrast imaging is achieved using a sample mask 8 and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through sample (14) and arrive at individual pixels (12) of the detector (4) through detector mask (6). The individual x-ray beams are arranged to hit the pixel edge (20) of individual rows of pixels, individual columns of pixels or individual pixels. Small deviations ? in the individual beams (16) cause a significant increase or decrease in the signal hitting the exposed area (22) of the pixel resulting in a significant phase contrast signal.
    Type: Grant
    Filed: September 3, 2007
    Date of Patent: January 11, 2011
    Assignee: UCL Business PLC
    Inventors: Alessandro Olivo, Robert D. Speller
  • Publication number: 20100054415
    Abstract: Phase contrast imaging is achieved using a sample mask 8 and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through sample (14) and arrive at individual pixels (12) of the detector (4) through detector mask (6). The individual x-ray beams are arranged to hit the pixel edge (20) of individual rows of pixels, individual columns of pixels or individual pixels. Small deviations ? in the individual beams (16) cause a significant increase or decrease in the signal hitting the exposed area (22) of the pixel resulting in a significant phase contrast signal.
    Type: Application
    Filed: September 3, 2007
    Publication date: March 4, 2010
    Applicant: UCL Business PLC
    Inventors: Alessandro Olivo, Robert D. Speller