Patents by Inventor Alex Andrea

Alex Andrea has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of printing and printing system
    Publication number: 20080192078
    Abstract: A method of printing comprising: determining the position of ink marks on a medium resulting from the breakaway of secondary ink drops from primary ink drops; and positioning the primary ink drops on the medium using said determination.
    Type: Application
    Filed: January 28, 2008
    Publication date: August 14, 2008
    Inventors: Alex Andrea, Joan Jorba, Sergio Puigardeu
  • Calibration method for a printer
    Patent number: 7380898
    Abstract: The invention relates to a calibration method for a printer having a mechanism for advancing a medium in a direction of media advance comprising the following steps: a—providing a printhead, the printhead having a swath height in the direction of media advance; b—providing an estimate of either the swath height or the characteristic of the mechanism; c—printing a base pattern on a medium using the printhead; d—printing an overlay pattern on the medium using the printhead to form an interference pattern; e—advance the medium of a predetermined distance using the mechanism at a time between the printing of the base pattern and the printing of the overlay pattern; f—analyze an optical evaluation of the interference pattern; g—evaluate as either: i—the swath height if the characteristic of the mechanism is known or estimated; or ii—the characteristic of the mechanism if the swath height is known or estimated.
    Type: Grant
    Filed: October 3, 2005
    Date of Patent: June 3, 2008
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Jean Frederic Plante, Alex Andrea, Pascal Ruiz, Joan Campderros, Angel Martinez Barambio, Alejandro Campillo, Marcos Casaldaliga
  • Calibration method for a printer
    Publication number: 20070076039
    Abstract: The invention relates to a calibration method for a printer having a mechanism for advancing a medium in a direction of media advance comprising the following steps: (a) providing a printhead, the printhead having a swath height in the direction of media advance; (b) providing an estimate of either the swath height or the characteristic of the mechanism; (c) printing a base pattern on a medium using the printhead; (d) printing an overlay pattern on the medium using the printhead to form an interference pattern; (e) advance the medium of a predetermined distance using the mechanism at a time between the printing of the base pattern and the printing of the overlay pattern; (f) analyze an optical evaluation of the interference pattern; (g) evaluate as either: (i) the swath height if the characteristic of the mechanism is known or estimated; or (ii) the characteristic of the mechanism if the swath height is known or estimated.
    Type: Application
    Filed: June 7, 2006
    Publication date: April 5, 2007
    Inventors: Pasqual Batalla, Jordi Sender, Marc Bautista, Toni Gracia, Angel Alvarez, Jean Plante, Alex Andrea, Pascal Ruiz, Joan Campderros, Angel Barambio, Alejandro Campillo, Marcos Casaldaliga
  • Calibration method for a printer
    Publication number: 20070076038
    Abstract: The invention relates to a calibration method for a printer having a mechanism for advancing a medium in a direction of media advance comprising the following steps: a- providing a printhead, the printhead having a swath height in the direction of media advance; b- providing an estimate of either the swath height or the characteristic of the mechanism; c- printing a base pattern on a medium using the printhead; d- printing an overlay pattern on the medium using the printhead to form an interference pattern; e- advance the medium of a predetermined distance using the mechanism at a time between the printing of the base pattern and the printing of the overlay pattern; f- analyze an optical evaluation of the interference pattern; g- evaluate as either: i- the swath height if the characteristic of the mechanism is known or estimated; or ii- the characteristic of the mechanism if the swath height is known or estimated.
    Type: Application
    Filed: October 3, 2005
    Publication date: April 5, 2007
    Inventors: Jean Plante, Alex Andrea, Pascal Ruiz, Joan Campderros, Angel Barambio, Alejandro Campillo, Marcos Casaldaliga