Patents by Inventor Alex Ballantyne

Alex Ballantyne has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6741641
    Abstract: An electronic system parameter, such as time deviation (TDEV), is measured by reference to an input series of data samples received and processed to produce in real-time first and second time-varying series of measurements for the parameter.
    Type: Grant
    Filed: May 18, 2000
    Date of Patent: May 25, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Alex Ballantyne, David Taylor
  • Patent number: 6601004
    Abstract: Timing errors in digital transmission systems, such as maximum time interval error, are measured with data samples processed in a first stage to produce in real-time a first, time-varying series of measurements for a given parameter over observation intervals of a first magnitude. Each observation interval is many times longer than the sample period of the input series. Subsequent stages derive further measurements, corresponding to increasingly longer observation intervals, derived by treating previous observation intervals as sub-intervals. The first stage derives intermediate results for a predetermined interval and repeats for successive sub-intervals. The intermediate results are stored in a first first-in, first-out (FIFO) data set and updated at least once per sub-interval and the required parameter is derived. The second and subsequent stages similarly derive the required parameter corresponding to increasing observation interval magnitudes and update the measurements as data sets update.
    Type: Grant
    Filed: May 1, 2001
    Date of Patent: July 29, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Alex Ballantyne, David Taylor
  • Publication number: 20010044701
    Abstract: Timing errors in digital transmission systems such as MTIE (340) in Synchronous Digital Hierarchy (SDH) systems are measured with data samples (225) processed in a first stage (260) to produce in real-time a first, time-varying series of measurements (300) for a given parameter over observation intervals of a first magnitude, each observation interval being many times longer than the sample period of the input series. Subsequent stages (280, 280′) derive further series of measurements, corresponding to increasingly longer observation intervals, derived by treating previous observation intervals as sub-intervals. The first stage (260) derives intermediate results for a pre-determined interval and repeats for successive sub-intervals, the intermediate results stored in a first first-in, first-out (FIFO) data set (300) and updated at least once per sub-interval and the required parameter derived (335).
    Type: Application
    Filed: May 1, 2001
    Publication date: November 22, 2001
    Applicant: Agilent Technologies, Inc.
    Inventors: Alex Ballantyne, David Taylor