Patents by Inventor Alex F. Schreiner

Alex F. Schreiner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Through substrate optical imaging device and method
    Patent number: 8110804
    Abstract: A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: February 7, 2012
    Assignee: Viscom AG
    Inventors: Taufiq Habib, Alex F. Schreiner, Jon Marson
  • Through-substrate optical imaging device and method
    Publication number: 20100181483
    Abstract: A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
    Type: Application
    Filed: October 16, 2009
    Publication date: July 22, 2010
    Inventors: Taufiq Habib, Alex F. Schreiner, Jon Marson