Patents by Inventor Alex Klajic

Alex Klajic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Laser production and product qualification via accelerated life testing based on statistical modeling
    Patent number: 7019548
    Abstract: A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
    Type: Grant
    Filed: May 26, 2005
    Date of Patent: March 28, 2006
    Assignee: Finisar Corporation
    Inventors: Song Miao, Chun Lei, Raj Cornelius, Alex Klajic
  • Laser production and product qualification via accelerated life testing based on statistical modeling
    Patent number: 6977517
    Abstract: A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
    Type: Grant
    Filed: May 19, 2003
    Date of Patent: December 20, 2005
    Assignee: Finisar Corporation
    Inventors: Song Miao, Chun Lei, Raj Cornelius, Alex Klajic
  • Laser production and product qualification via accelerated life testing based on statistical modeling
    Publication number: 20050218925
    Abstract: A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
    Type: Application
    Filed: May 26, 2005
    Publication date: October 6, 2005
    Inventors: Song Miao, Chun Lei, Raj Cornelius, Alex Klajic
  • Receive optical assembly with angled optical receiver
    Publication number: 20050196173
    Abstract: A receive optical subassembly comprises a header assembly positioned inside an outer shell that interfaces with a receive optical fiber. The header assembly comprises an upper surface upon which one or more optical components can be mounted, the upper surface defined at least in party by a standard plane. The header assembly further comprises an angled surface that is angled with respect to the standard plane. The angled surface can comprise, for example, a sloped cavity stamped inside the header assembly, or an angled shim positioned on top of the header assembly upper surface. An optical receiver mounted on the angled surface receives an incoming optical signal but reflects at least a portion of stray optical signals away from the incoming optical signal.
    Type: Application
    Filed: September 28, 2004
    Publication date: September 8, 2005
    Inventors: Stefano Schiaffino, Alex Klajic, Subra Nagarajan, Dincer Birincioglu, Mina Farr
  • Auto-alignment system with focused light beam
    Patent number: 6914237
    Abstract: Characterizing the surface responsivity of a photo-detector includes focusing a light beam on the photo-detector surface and measuring a response of the photo-detector. The focused light beam is scanned across the surface of the photo-detector. The response of the photo-detector at each position may be recorded to allow the responsivity of the photo-detector surface to be characterized.
    Type: Grant
    Filed: May 17, 2002
    Date of Patent: July 5, 2005
    Assignee: Finisar Corporation
    Inventors: Ting Shi, Dallas Meyer, Alex Klajic
  • Laser production and product qualification via accelerated life testing based on statistical modeling
    Publication number: 20040023422
    Abstract: A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
    Type: Application
    Filed: May 19, 2003
    Publication date: February 5, 2004
    Applicant: Finisar Corporation
    Inventors: Song Miao, Chun Lei, Raj Cornelius, Alex Klajic
  • Auto-alignment system with focused light beam
    Publication number: 20030155493
    Abstract: Characterizing the surface responsivity of a photo-detector includes focusing a light beam on the photo-detector surface and measuring a response of the photo-detector. The focused light beam is scanned across the surface of the photo-detector. The response of the photo-detector at each position may be recorded to allow the responsivity of the photo-detector surface to be characterized.
    Type: Application
    Filed: May 17, 2002
    Publication date: August 21, 2003
    Inventors: Ting Shi, Dallas Meyer, Alex Klajic