Patents by Inventor Alex Klooster

Alex Klooster has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7440114
    Abstract: An off axis paraboloid mirror is used to provide object illumination in an interferometric imaging system. The light from an object illumination light source diverges from a point apart from the focus point of the paraboloid, proceeds to the parabolic mirror surface, and is reflected as a nearly parallel beam to illuminate the object.
    Type: Grant
    Filed: December 12, 2005
    Date of Patent: October 21, 2008
    Assignee: Coherix, Inc.
    Inventors: Alex Klooster, Carl C. Aleksoff
  • Publication number: 20080236306
    Abstract: The invention includes a system and method for reducing convection current effects in the optical path of a holographic interferometer system. The system preferably includes an enclosure for the optical path of the holographic interferometer system. In one embodiment, the system also includes a thermal element coupled to or located inside the enclosure. In another embodiment, the system also includes a gas located inside the enclosure, wherein the gas has a lower index of refraction than air. In another embodiment, the system also includes a fan coupled to or located inside the enclosure and adapted to circulate a gas inside the enclosure.
    Type: Application
    Filed: October 1, 2007
    Publication date: October 2, 2008
    Inventors: Michael J. Mater, Alex Klooster, Greg Dale
  • Publication number: 20080150204
    Abstract: A vibration isolation platform having supports such as air pistons to damp out low frequency vibrations is equipped with a means for restricting pitch and roll motion as the weight distribution is changed and the vibration isolation platform exhibits vertical motion. The preferred means for restricting are torsion bars and tension means which transfer force from one part of the platform to the other.
    Type: Application
    Filed: November 1, 2007
    Publication date: June 26, 2008
    Applicant: Coherix, Inc
    Inventors: Alex klooster, Michael Mater
  • Patent number: 7359065
    Abstract: A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt angle and direction correction is added, and a third phase image is generated. Phase images of objects which are too large to be imaged in an interferometric imaging system can thus be produced.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: April 15, 2008
    Assignee: Coherix, Inc.
    Inventors: Jon Nisper, Michael Mater, Alex Klooster, Zhenhua Huang
  • Publication number: 20070133010
    Abstract: An off axis paraboloid mirror is used to provide object illumination in an interferometric imaging system. The light from an object illumination light source diverges from a point apart from the focus point of the paraboloid, proceeds to the parabolic mirror surface, and is reflected as a nearly parallel beam to illuminate the object.
    Type: Application
    Filed: December 12, 2005
    Publication date: June 14, 2007
    Inventors: Alex Klooster, Carl Aleksoff
  • Publication number: 20070133008
    Abstract: An optical fiber is used to deliver a reference beam in an interferometric imaging system having an off-axis paraboloid collimating and imaging mirror. A controllable fiber optic beam splitter controls the ratio of light from an optical fiber delivered to an object illumination beam and to the reference beam.
    Type: Application
    Filed: December 12, 2005
    Publication date: June 14, 2007
    Applicant: Coherix, Inc.
    Inventors: Alex Klooster, Carl Aleksoff
  • Publication number: 20070024866
    Abstract: A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt angle and direction correction is added, and a third phase image is generated. Phase images of objects which are too large to be imaged in an interferometric imaging system can thus be produced.
    Type: Application
    Filed: July 14, 2005
    Publication date: February 1, 2007
    Applicant: Coherix, Inc
    Inventors: Jon Nisper, Mike Mater, Alex Klooster, Zhenhua Huang
  • Publication number: 20060227820
    Abstract: A tunable extended cavity laser is disclosed having a single flexure pivot or hinge forming a pivot axis about which a grating tuning element is rotated. The pivot axis does not move appreciably as the grating is pivoted. The most preferred embodiment of the flexure hinge is a cartwheel hinge.
    Type: Application
    Filed: March 30, 2005
    Publication date: October 12, 2006
    Applicant: Coherix, Inc.
    Inventor: Alex Klooster
  • Publication number: 20060227821
    Abstract: A tunable extended cavity laser is disclosed having a single flexure pivot or hinge forming a pivot axis about which a grating tuning element is rotated. The pivot axis does not move appreciably as the grating is pivoted. The most preferred embodiment of the flexure hinge is a cartwheel hinge.
    Type: Application
    Filed: March 30, 2005
    Publication date: October 12, 2006
    Applicant: Coherix, Inc.
    Inventor: Alex Klooster
  • Patent number: 6898350
    Abstract: Techniques are used to determine when interfering beams of light are precisely aligned at the core of the fiber when a laser interferometer is used to burn diffraction gratings into optical fibers. Two alternative methods are disclosed for performing this function, namely, refraction of the UV fluorescence through the fiber onto a paper or screen, and alternately interrupting the left and right UV beams, then directly observing the fluorescence pattern of the UV beam on the fiber core to determine alignment.
    Type: Grant
    Filed: August 19, 2003
    Date of Patent: May 24, 2005
    Assignee: General Dynamics Advanced Information Systems, Inc.
    Inventors: Amber Iler, Alex Klooster
  • Patent number: 6868736
    Abstract: The fiber optic pressure sensing system includes a sensor housing formed using MEMS processing. The sensor housing has ribs and grooves in both horizontal and vertical directions relative to the surface to allow the membrane to flex in a consistent manner. The flexing of the membrane allows the pedestal to be repeatedly positioned in response to pressure acting on the extension of the sensor head and membrane.
    Type: Grant
    Filed: February 21, 2003
    Date of Patent: March 22, 2005
    Assignee: Sentec Corporation
    Inventors: Takeo Sawatari, Alex Klooster, Dean M. Aslam, Yuping Lin, James Marks
  • Publication number: 20040081400
    Abstract: Techniques are used to determine when interfering beams of light are precisely aligned at the core of the fiber when a laser interferometer is used to burn diffraction gratings into optical fibers. Two alternative methods are disclosed for performing this function, namely, refraction of the UV fluorescence through the fiber onto a paper or screen, and alternately interrupting the left and right UV beams, then directly observing the fluorescence pattern of the UV beam on the fiber core to determine alignment.
    Type: Application
    Filed: August 19, 2003
    Publication date: April 29, 2004
    Inventors: Amber Iler, Alex Klooster
  • Publication number: 20030159518
    Abstract: The fiber optic pressure sensing system includes a sensor housing formed using MEMS processing. The sensor housing has ribs and grooves in both horizontal and vertical directions relative to the surface to allow the membrane to flex in a consistent manner. The flexing of the membrane allows the pedestal to be repeatedly positioned in response to pressure acting on the extension of the sensor head and membrane.
    Type: Application
    Filed: February 21, 2003
    Publication date: August 28, 2003
    Inventors: Takeo Sawatari, Alex Klooster, Dean M. Aslam, Yuping Lin, James Marks
  • Patent number: 6597446
    Abstract: A holographic scatterometer with continuous readout can rapidly identify the presence of deposits (particles or other defects) on an unpatterned wafer surface and determine the volume density (size) and location. The scatterometer can also determine chemical composition of the detected deposits. The range of the deposit (particle) size to be measured is below 80 nm, which currently existing scatterometer type instruments cannot readily detect. The inspection can be achieved as an in-line stage during the processing of wafers or in situ in combination with another processing tool or as a separate off-line analysis device.
    Type: Grant
    Filed: March 22, 2001
    Date of Patent: July 22, 2003
    Assignee: Sentec Corporation
    Inventors: Alex Klooster, James M. Marks, Takeo Sawatari
  • Publication number: 20020159052
    Abstract: A holographic scatterometer with continuous readout can rapidly identify the presence of deposits (particles or other defects) on an unpatterned wafer surface and determine the volume density (size) and location. The scatterometer can also determine chemical composition of the detected deposits. The range of the deposit (particle) size to be measured is below 80 nm, which currently existing scatterometer type instruments cannot readily detect. The inspection can be achieved as an in-line stage during the processing of wafers or in situ in combination with another processing tool or as a separate off-line analysis device.
    Type: Application
    Filed: March 22, 2001
    Publication date: October 31, 2002
    Inventors: Alex Klooster, James M. Marks, Takeo Sawatari
  • Patent number: 5923423
    Abstract: A scatterometer for detecting and analyzing wafer surface defects includes a light source generating a beam of light and a photodetector. Optics are used for splitting the beam of light into a reference beam and a detection beam. Optics also direct the reference beam and the detection beam to the photodetector through different optical paths. The optics direct the detection beam to the surface of the wafer and when incident upon a defect creates a scattered beam. The optics direct the scattered beam to the photodetector. A driver moves the surface of the wafer with respect to the detection beam. A computer coupled to the photodetector determines the presence of a defect on the surface by analyzing an interference pattern from the superposition of the reference beam and the scattered beam.
    Type: Grant
    Filed: September 4, 1997
    Date of Patent: July 13, 1999
    Assignee: Sentec Corporation
    Inventors: Takeo Sawatari, Philip A. Gaubis, Alex Klooster, James M. Marks
  • Patent number: 4275454
    Abstract: A method for compensating for phase errors in an optical data processing system for performing a Fourier transformation analysis of a data source. The aberrations of the system are holographically recorded by passing an object beam through the system and the optical data source in a direction opposite to that of the DC read beam used in the transformation analysis. The object beam and a reference beam derived from a common coherent light source are generated by the system and directed to an optical memory wherein the interference pattern between the object and reference beam is recorded. The data source is analyzed by providing a read beam incident the optical memory along a path in the reverse direction of the reference beam. In such manner, a reconstruction beam emanating from the hologram is directed back through the data source to display the Fourier transform of the data in the data source.
    Type: Grant
    Filed: December 1, 1978
    Date of Patent: June 23, 1981
    Assignee: Environmental Research Institute of Michigan
    Inventor: Alex Klooster, Jr.