Patents by Inventor Alex Kurnia Choi

Alex Kurnia Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for programmable automatic testing of power supplied
    Patent number: 8589110
    Abstract: A cost-effective system architecture and apparatus for programmable automatic power supply testing. The system utilizes board level interface between various system testing modules and an Automatic Test Controller (ATC). The ATC receives coded test requests from the software on an industrial PC and control the various testing modules inside ATC to execute the tests. Test results were sent back to the PC and saved in a result file. A single industrial PC can control two or more ATC's and test two or more power supply units simultaneously. The ATC based test system is lower cost than the conventional Automatic Test Equipment which uses device level interface and standardized test devices.
    Type: Grant
    Filed: March 3, 2009
    Date of Patent: November 19, 2013
    Assignee: Synergistic Technologies Solutions, Inc.
    Inventors: Guang Liu, Alex Kurnia Choi
  • System architecture and apparatus for programmable automatic power supply testing
    Publication number: 20100225466
    Abstract: A cost-effective system architecture and apparatus for programmable automatic power supply testing. The system utilizes board level interface between various system testing modules and an Automatic Test Controller (ATC). The ATC receives coded test requests from the software on an industrial PC and control the various testing modules inside ATC to execute the tests. Test results were sent back to the PC and saved in a result file. A single industrial PC can control two or more ATC's and test two or more power supply units simultaneously. The ATC based test system is lower cost than the conventional Automatic Test Equipment which uses device level interface and standardized test devices.
    Type: Application
    Filed: March 3, 2009
    Publication date: September 9, 2010
    Inventors: Guang Liu, Alex Kurnia Choi