Patents by Inventor Alex LOPEZ ZORZANO

Alex LOPEZ ZORZANO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quality inspection of thin film materials
    Patent number: 10267836
    Abstract: Devices and methods for determining the quality thin film materials are disclosed. The thin film materials are provided on substrates forming thin film material structures. The devices comprise a housing, a THz module with a THz source emitter and a THz detector, and a reflective base moveable relative to the THz module and configured to support the thin film material structures. The THz source emitter is configured to irradiate the thin film materials. The THz detector is configured to measure at least one reflection of the irradiation. The device is configured to calculate a parameter indicative of the quality of the thin film material based on said reflection measurements.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: April 23, 2019
    Assignees: DAS-NANO, S.L., ASOCIACION CENTRO DE INVESTIGACION COOPERATIVE EN NANOCIENCIAS (CIC NANOGUNE), GRAPHENEA, S.A.
    Inventors: Eduardo Azanza Ladrón, Magdalena Chudzik, Alex López Zorzano, David Etayo Salinas, Luis Eduardo Hueso Arroyo, Amaia Zurutuza Elorza
  • QUALITY INSPECTION OF THIN FILM MATERIALS
    Publication number: 20180164354
    Abstract: Devices and methods for determining the quality thin film materials are disclosed. The thin film materials are provided on substrates forming thin film material structures. The devices comprise a housing, a THz module with a THz source emitter and a THz detector,and a reflective base moveable relative to the THz module and configured to support the thin film material structures. The THz source emitter is configured to irradiate the thin film materials. The THz detector is configured to measure at least one reflection of the irradiation. The device is configured to calculate a parameter indicative of the quality of the thin film material based on said reflection measurements.
    Type: Application
    Filed: December 23, 2014
    Publication date: June 14, 2018
    Inventors: Eduardo AZANZA LADRÓN, Magdalena CHUDZIK, Alex LOPEZ ZORZANO, David ETAYO SALINAS, Luis Eduardo HUESO ARROYO, Amaia ZURUTUZA ELORZA
  • COUNTING STACKED PLANAR SUBSTRATES
    Publication number: 20180121782
    Abstract: Devices and methods for counting planar substrates stacked on a first plane are disclosed. Image capturing sensors are arranged collinearly in a manner substantially perpendicular to the first plane. The image capturing sensors are configured to capture images of portions of counting sides of the stacked planar substrates. The image capturing sensors are configured so that the images captured by every two consecutive image capturing sensors comprise an overlapping portion of the stacked planar substrates.
    Type: Application
    Filed: April 21, 2015
    Publication date: May 3, 2018
    Inventors: Guillermo BARBADILLO VILLANUEVA, Eduardo AZANZA LADRÓN, Magdalena CHUDZIK, Mikel SUBIZA GARCÍA, Alex LÓPEZ ZORZANO, Daniel ZABALA RAZQUIN