Patents by Inventor Alex Mordehai

Alex Mordehai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7547891
    Abstract: The present invention provides ion sampling apparatuses that can be used in a fast polarity-switching electric field. In some embodiments, the ion sampling apparatus comprises a capillary made with an insulator, with a resistive inner or outer surface. Devices and systems comprising the ion sampling apparatuses, as well as methods of use thereof, are also provided.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: June 16, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Alex Mordehai, Craig P. Love, Mark H. Werlich
  • Publication number: 20080197275
    Abstract: The present invention provides ion sampling apparatuses that can be used in a fast polarity-switching electric field. In some embodiments, the ion sampling apparatus comprises a capillary made with an insulator, with a resistive inner or outer surface. Devices and systems comprising the ion sampling apparatuses, as well as methods of use thereof, are also provided.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Alex Mordehai, Craig P. Love, Mark H. Werlich
  • Publication number: 20070205360
    Abstract: Apparatus for delivering ions to the mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.
    Type: Application
    Filed: February 20, 2007
    Publication date: September 6, 2007
    Inventor: Alex Mordehai
  • Publication number: 20070045531
    Abstract: The invention provides a device for introducing ions into the primary ion path of a mass spectrometry system. In general, the device contains an electrical lens having a primary ion passageway and a secondary ion passageway that merges with the primary ion passageway. In certain embodiments, the electrical lens contains a first part and a second part that, together, form the primary ion passageway. The first part of the lens may contain the secondary ion passageway.
    Type: Application
    Filed: August 31, 2005
    Publication date: March 1, 2007
    Inventors: Alex Mordehai, Gangqiang Li, Stuart Hansen
  • Patent number: 7183542
    Abstract: Apparatus for delivering ions to a mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: February 27, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Alex Mordehai
  • Patent number: 7166837
    Abstract: A mass analyzer for isolating, fragmenting and scanning ions. The mass analyzer includes an ion trap having a first electrode, a second electrode adjacent to the first electrode, and a third electrode interposed between the first electrode and the second electrode, a first RF source electrically connected to the first electrode and second electrode and a second RF voltage source electrically connected to the third electrode. The second RF voltage source provides for a second electrical field for fragmenting ions and broadens the potential application of the fragmentation cut-off of the device allowing for analysis of peptides and other complex molecules. The mass analyzer may be used independently or in combination with a mass spectrometry system. A method of ion fragmentation and cut-off is also disclosed.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: January 23, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Alex Mordehai
  • Publication number: 20060208187
    Abstract: The present invention relates to an apparatus and method for providing improved sensitivity and duty cycle in a mass spectrometry system. The mass spectrometry system of the present invention includes an ionization source, a mass analyzer/filter and an ion detector. The mass analyzer has a first trapping section, a second trapping section and a gating section interposed between the first trapping section and the second trapping section. The device may further include one or more lenses adjacent to the gating or trapping sections. The invention also provides an ion trap. The ion trap of the present invention has a first trapping section, a second trapping section and a gating section interposed between the first trapping section and the second trapping section. The gating and trapping sections may be in a linear arrangement. A method regarding the application of the present invention is also described.
    Type: Application
    Filed: March 18, 2005
    Publication date: September 21, 2006
    Inventors: Alex Mordehai, Bryan Miller
  • Publication number: 20050194529
    Abstract: Apparatus for delivering ions to a mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.
    Type: Application
    Filed: April 27, 2005
    Publication date: September 8, 2005
    Inventor: Alex Mordehai
  • Patent number: 6914242
    Abstract: Apparatus for delivering ions to a mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.
    Type: Grant
    Filed: December 6, 2002
    Date of Patent: July 5, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Alex Mordehai
  • Publication number: 20040119014
    Abstract: A mass spectrometer having an ionization source, a ion trap mass analyzer, an ion guide and gating apparatus between the ion guide and the ion trap. The gating apparatus includes sealing apparatus. A stream of ions from the ion source are guided to through the gating apparatus in pulses to the ion trap. The number of ions in each pulse are controlled by the scaling apparatus.
    Type: Application
    Filed: December 18, 2002
    Publication date: June 24, 2004
    Inventor: Alex Mordehai
  • Publication number: 20040108455
    Abstract: Apparatus for delivering ions to a mass analyzer. The apparatus includes a time of flight ion guide, a pulsing device for receiving a continuous ion stream containing ions of different atomic mass and for delivering pulses of ions to the ion guide wherein ions in each of the pulses of ions exit the ion guide in ascending order of their atomic mass, and a gating device at the exit end of the ion guide for allowing ions of a predetermined atomic mass to pass to the mass analyzer.
    Type: Application
    Filed: December 6, 2002
    Publication date: June 10, 2004
    Inventor: Alex Mordehai
  • Patent number: 6703610
    Abstract: The present invention relates to a method and apparatus for a mass spectrometer. The skimmer of the present invention has a surface to reduce the overall interaction and deposition of unwanted compounds. The surface of the skimmer may be formed from an inorganic conductive nitride or may be applied to a substrate as a coating. The invention also includes a method for reducing the interaction or deposition of compounds on a mass spectrometer skimmer by application or coating the skimmer with an inert conductive material.
    Type: Grant
    Filed: February 1, 2002
    Date of Patent: March 9, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Alex Mordehai
  • Patent number: 6624409
    Abstract: A substrate for matrix assisted laser desorption ionization mass spectrometry. The substrate has a layer of a nitride composition on the surface of the substrate. The nitride composition is a major amount by weight from the group of titanium nitride, zirconium nitride and hafnium nitride.
    Type: Grant
    Filed: July 30, 2002
    Date of Patent: September 23, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Alex Mordehai, Jian Bai
  • Publication number: 20030146378
    Abstract: The present invention relates to a method and apparatus for a mass spectrometer. The skimmer of the present invention has a surface to reduce the overall interaction and deposition of unwanted compounds. The surface of the skimmer may be formed from an inorganic conductive nitride or may be applied to a substrate as a coating. The invention also includes a method for reducing the interaction or deposition of compounds on a mass spectrometer skimmer by application or coating the skimmer with an inert conductive material.
    Type: Application
    Filed: February 1, 2002
    Publication date: August 7, 2003
    Inventor: Alex Mordehai
  • Patent number: 5729014
    Abstract: A method of ion collection over a wide mass-to-charge range from continuous ion source into a quadrupole ion trap filled with a buffer gas directing an ion beam, from an external ion source to a radio frequency ion trap through a gating device for a predetermined period of accumulation time to allow the beam to enter the trap, trapping ions over a range of masses by applying a radio frequency voltage to the trap and changing an amplitude of the radio frequency voltage adiabatically to achieve a uniform trapping efficiency for ions over a predetermined mass range. The predetermined period of accumulation time may be divided into a plurality of segments, and the amplitude of the radio-frequency voltage is changing adiabatically within each segment.
    Type: Grant
    Filed: July 11, 1996
    Date of Patent: March 17, 1998
    Assignee: Varian Associates, Inc.
    Inventors: Alex Mordehai, Sidney E. Buttrill, Jr.
  • Patent number: 5650617
    Abstract: A method and mass spectrometer system for trapping ions within an ion trap by increasing the flight path of ions therein. An ion beam is produced by external ion source and is directed to the ion trap which comprises at least one trapping electrode in proximity to an exit region of the ion beam from the ion trap. A retarding DC voltage is applied to the trapping electrode during ion accumulation time for creating a fringing reflection field and for retaining ions within the ion trap.
    Type: Grant
    Filed: July 30, 1996
    Date of Patent: July 22, 1997
    Assignee: Varian Associates, Inc.
    Inventor: Alex Mordehai
  • Patent number: 5352892
    Abstract: A novel atmospheric pressure ionization device for the transport of charged particle produced by at atmospheric pressure to a mass analyzer includes a liquid shield between the particle source and the sample inlet into the mass analyzer. The liquid shield may be in the form of a disk with a central aperture and acts as a spray splitter and aerofocusing device which increases the flow rate of a liquid sample into the analyzer. The mass analyzer is located in a high vacuum region and an intermediate low vacuum region is provided between the sample inlet and the analyzer. An ion optical system includes electrostatic lens assemblies in said vacuum regions for transporting charged particles from the inlet to the analyzer.
    Type: Grant
    Filed: January 26, 1993
    Date of Patent: October 4, 1994
    Assignee: Cornell Research Foundation, Inc.
    Inventors: Alex Mordehai, Gerard Hopfgartner, John D. Henion
  • Patent number: 5268572
    Abstract: An ion trap mass spectrometer includes an ion trap region separated from an electron multiplier region by a baffle, and separate turbomolecular pumps for pumping each region to a different pressure level. The ion trap region can therefore be pumped to a higher pressure level than ca be used for the electron multiplier region, and the result and increase in pressure of damping gas in the ion trap region increases the sensitivity of the device.
    Type: Grant
    Filed: September 23, 1992
    Date of Patent: December 7, 1993
    Assignee: Cornell Research Foundation, Inc.
    Inventors: Alex Mordehai, John D. Henion