Patents by Inventor Alex P. Ivaschenko
Alex P. Ivaschenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7132123Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: GrantFiled: July 29, 2003Date of Patent: November 7, 2006Assignee: Cymer, Inc.Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko, Walter Gillespie, Curtis Rettig
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Patent number: 6937635Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: GrantFiled: August 7, 2003Date of Patent: August 30, 2005Assignee: Cymer, Inc.Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko, Walter Gillespie, Curtis Rettig
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Patent number: 6914919Abstract: The present invention provides gas discharge laser systems capable of reliable long-term operation in a production line capacity at repetition rates in the range of 6,000 to 10,0000 pulses power second. Preferred embodiments are configured as KrF, ArF and F2 lasers used for light sources for integrated circuit lithography. Improvements include a modified high voltage power supply capable for charging an initial capacitor of a magnetic compression pulse power system to precise target voltages 6,000 to 10,0000 times per second and a feedback control for monitoring pulse energy and determining the target voltages on a pulse-by-pulse basis. Several techniques are disclosed for removing discharge created debris from the discharge region between the laser electrodes during the intervals between discharges. In one embodiment the width of the discharge region is reduced from about 3 mm to about 1 mm so that a gas circulation system designed for 4,000 Hz operation could be utilized for 10,000 Hz operation.Type: GrantFiled: June 28, 2002Date of Patent: July 5, 2005Assignee: Cymer, Inc.Inventors: Tom A. Watson, Richard C. Ujazdowski, Alex P. Ivaschenko, Richard L. Sandstrom, Robert A. Shannon, R. Kyle Webb, Frederick A. Palenschat, Thomas Hofmann, Curtis L. Rettig, Richard M. Ness, Paul C. Melcher, Alexander I. Ershov
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Patent number: 6882674Abstract: The present invention provides an excimer laser capable of producing a high quality pulsed laser beam at pulse rates of about 4,000 Hz at pulse energies of about 5 mJ or greater. A preferred embodiment is an ArF excimer laser specifically designed as a light source for integrated circuit lithography. An improved wavemeter with special software monitors output beam parameters and controls a very fast PZT driven tuning mirror and the pulse power charging voltage to maintain wavelength and pulse energy within desired limits. In a preferred embodiment two fan motors drive a single tangential fan which provides sufficient gas flow to clear discharge debris from the discharge region during the approximately 0.25 milliseconds between pulses.Type: GrantFiled: December 21, 2001Date of Patent: April 19, 2005Assignee: Cymer, Inc.Inventors: Christian J. Wittak, William N. Partlo, Richard L. Sandstrom, Paul C. Melcher, David M. Johns, Robert B. Saethre, Richard M. Ness, Curtis L. Rettig, Robert A. Shannon, Richard C. Ujazdowski, Shahryar Rokni, Scott T. Smith, Stuart L. Anderson, John M. Algots, Ronald L. Spangler, Igor V. Fomenkov, Thomas D. Steiger, Jerome A. Emilo, Clay C. Titus, Alex P. Ivaschenko, Paolo Zambon, Gamaralalage G. Padmabandu, Mark S. Branham, Sunjay Phatak, Raymond F. Cybulski
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Patent number: 6795474Abstract: An excimer laser with a purged beam path capable of producing a high quality pulsed laser beam at pulse rates in excess of 2,000 Hz at pulse energies of about 5 mJ or greater. The entire purged beam path through the laser system is sealed to minimize contamination of the beam path. A preferred embodiment comprises a thermally decoupled LNP aperture element to minimize thermal distortions in the LNP. This preferred embodiment is an ArF excimer laser specifically designed as a light source for integrated circuit lithography. An improved wavemeter is provided with a special purge of a compartment exposed to the output laser beam.Type: GrantFiled: November 14, 2001Date of Patent: September 21, 2004Assignee: Cymer, Inc.Inventors: William N. Partlo, Richard L. Sandstrom, Holzer K. Glatzel, Raymond F. Cybulski, Peter C. Newman, James K. Howey, William G. Hulburd, John T. Melchior, Alex P. Ivaschenko
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Publication number: 20040037338Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: ApplicationFiled: August 7, 2003Publication date: February 26, 2004Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko, Walter Gillespie, Curtis Rettig
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Patent number: 6690706Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: GrantFiled: March 22, 2002Date of Patent: February 10, 2004Assignee: Cymer, Inc.Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko
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Publication number: 20040022292Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: ApplicationFiled: July 29, 2003Publication date: February 5, 2004Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko, Walter Gillespie, Curtis Rettig
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Publication number: 20030118072Abstract: The present invention provides an excimer laser capable of producing a high quality pulsed laser beam at pulse rates of about 4,000 Hz at pulse energies of about 5 mJ or greater. A preferred embodiment is an ArF excimer laser specifically designed as a light source for integrated circuit lithography. An improved wavemeter with special software monitors output beam parameters and controls a very fast PZT driven tuning mirror and the pulse power charging voltage to maintain wavelength and pulse energy within desired limits. In a preferred embodiment two fan motors drive a single tangential fan which provides sufficient gas flow to clear discharge debris from the discharge region during the approximately 0.25 milliseconds between pulses.Type: ApplicationFiled: December 21, 2001Publication date: June 26, 2003Inventors: Christian J. Wittak, William N. Partlo, Richard L. Sandstrom, Paul C. Melcher, David M. Johns, Robert B. Saethre, Richard M. Ness, Curtis L. Rettig, Robert A. Shannon, Richard C. Ujazdowski, Shahryar Rokni, Scott T. Smith, Stuart L. Anderson, John M. Algots, Ronald L. Spangler, Igor V. Fomenkov, Thomas D. Steiger, Jerome A. Emilo, Clay C. Titus, Alex P. Ivaschenko, Paolo Zambon, Gamaralalage G. Padmabandu, Mark S. Branham, Sunjay Phatak, Raymond F. Cybulski
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Publication number: 20030012234Abstract: The present invention provides gas discharge laser systems capable of reliable long-term operation in a production line capacity at repetition rates in the range of 6,000 to 10,0000 pulses power second. Preferred embodiments are configured as KrF, ArF and F2 lasers used for light sources for integrated circuit lithography. Improvements include a modified high voltage power supply capable for charging an initial capacitor of a magnetic compression pulse power system to precise target voltages 6,000 to 10,0000 times per second and a feedback control for monitoring pulse energy and determining the target voltages on a pulse-by-pulse basis. Several techniques are disclosed for removing discharge created debris from the discharge region between the laser electrodes during the intervals between discharges. In one embodiment the width of the discharge region is reduced from about 3 mm to about 1 mm so that a gas circulation system designed for 4,000 Hz operation could be utilized for 10,000 Hz operation.Type: ApplicationFiled: June 28, 2002Publication date: January 16, 2003Inventors: Tom A. Watson, Richard C. Ujazdowski, Alex P. Ivaschenko, Richard L. Sandstrom, Robert A. Shannon, R. Kyle Webb, Frederick A. Palenschat, Thomas Hofmann, Curtis L. Rettig, Richard M. Ness, Paul C. Melcher, Alexander I. Ershov
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Publication number: 20020191661Abstract: The present invention provides a gas discharge laser having at least one long-life elongated electrode for producing at least 12 billion high voltage electric discharges in a fluorine containing laser gas. In a preferred embodiment at least one of the electrodes is comprised of a first material having a relatively low anode erosion rate and a second anode material having a relatively higher anode erosion rate. The first anode material is positioned at a desired anode discharge region of the electrode. The second anode material is located adjacent to the first anode material along at least two long sides of the first material. During operation of the laser erosion occurs on both materials but the higher erosion rate of the second material assures that any tendency of the discharge to spread onto the second material will quickly erode away the second material enough to stop the spread of the discharge.Type: ApplicationFiled: March 22, 2002Publication date: December 19, 2002Inventors: Richard G. Morton, Timothy S. Dyer, Thomas D. Steiger, Richard C. Ujazdowski, Tom A. Watson, Bryan Moosman, Alex P. Ivaschenko
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Patent number: 6442181Abstract: A gas discharge laser capable of operating at pulse rates in the range of 4,000 Hz to 6,000 Hz at pulse energies in the range of 5 mJ to 10 mJ or greater.Type: GrantFiled: October 6, 2000Date of Patent: August 27, 2002Assignee: Cymer, Inc.Inventors: I. Roger Oliver, William N. Partlo, Richard M. Ness, Richard L. Sandstrom, Stuart L. Anderson, Alex P. Ivaschenko, James K. Howey, Vladimir Kulgeyko, Jean-Marc Hueber, Daniel L. Birx
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Publication number: 20020105994Abstract: An excimer laser with a purged beam path capable of producing a high quality pulsed laser beam at pulse rates in excess of 2,000 Hz at pulse energies of about 5 mJ or greater. The entire purged beam path through the laser system is sealed to minimize contamination of the beam path. A preferred embodiment comprises a thermally decoupled LNP aperture element to minimize thermal distortions in the LNP. This preferred embodiment is an ArF excimer laser specifically designed as a light source for integrated circuit lithography. An improved wavemeter is provided with a special purge of a compartment exposed to the output laser beam.Type: ApplicationFiled: November 14, 2001Publication date: August 8, 2002Inventors: William N. Partlo, Richard L. Sandstrom, Holger K. Glatzel, Raymond F. Cybulski, Peter C. Newman, James K. Howey, William G. Hulburd, John T. Melchior, Alex P. Ivaschenko
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Patent number: 6425559Abstract: A chamber/optics support structure for a laser having a laser chamber with a vibration source. The chamber and the laser resonance cavity optical elements are supported on a platform. The chamber is supported by a plurality of wheels which in turn rests on two tracks on track supports mounted on the platform. A vertical vibration isolator isolates vertical vibrations originating in the chamber from the laser optics. A flexible clamp flexibly clamps the chamber in a horizontal position to align it with the resonance cavity optical elements and to substantially decouple vibration between the chamber vibration source to the optical elements in a frequency range of concern. The invention is especially useful for positioning the heavy laser chamber of a narrow band excimer laser and for decoupling vibrations resulting from its blower from the lasers line narrowing module and output coupler.Type: GrantFiled: September 29, 2000Date of Patent: July 30, 2002Assignee: Cymer, Inc.Inventors: I. Roger Oliver, Alex P. Ivaschenko, William N. Partlo, Palash P. Das