Patents by Inventor Alex PAIKIN

Alex PAIKIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for dynamic Rdson measurement
    Patent number: 10571511
    Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: February 25, 2020
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Alex Paikin, Colin Johnson, Tathagata Chatterjee, Sameer Pendharkar
  • SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
    Publication number: 20190011493
    Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.
    Type: Application
    Filed: September 13, 2018
    Publication date: January 10, 2019
    Inventors: Alex PAIKIN, Colin JOHNSON, Tathagata CHATTERJEE, Sameer PENDHARKAR
  • Systems and methods for dynamic Rdson measurement
    Patent number: 10101382
    Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: October 16, 2018
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Alex Paikin, Colin Johnson, Tathagata Chatterjee, Sameer Pendharkar
  • SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
    Publication number: 20180188313
    Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.
    Type: Application
    Filed: December 30, 2016
    Publication date: July 5, 2018
    Inventors: Alex PAIKIN, Colin JOHNSON, Tathagata CHATTERJEE, Sameer PENDHARKAR