Patents by Inventor Alex S. Poles

Alex S. Poles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11318550
    Abstract: A cleaning material, device, and method for predictably cleaning the capillary tube for a wire bonding machine in which the cleaning pad has a predetermined configuration appropriate for the particular wire bonding machine and a substrate having a defined functionalized surface topology and geometry which can be introduced into the wire bonding machine during the normal wire bonding operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: May 3, 2022
    Assignee: International Test Solutions, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles, Wayne C. Smith, Janakraj Shivlal
  • Publication number: 20220093394
    Abstract: A cleaning material, device, and method for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, in which the cleaning pad has a predetermined configuration appropriate for the particular pin contact elements and a substrate having a defined functionalized surface topology and geometry which can be introduced into the testing apparatus during the normal testing operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Application
    Filed: December 2, 2021
    Publication date: March 24, 2022
    Applicant: INTERNATIONAL TEST SOLUTIONS, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles
  • Patent number: 11211242
    Abstract: A cleaning material, device, and method for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, in which the cleaning pad has a predetermined configuration appropriate for the particular pin contact elements and a substrate having a defined functionalized surface topology and geometry which can be introduced into the testing apparatus during the normal testing operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: December 28, 2021
    Assignee: INTERNATIONAL TEST SOLUTIONS, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles
  • Publication number: 20210146464
    Abstract: A cleaning material, device, and method for predictably cleaning the capillary tube for a wire bonding machine in which the cleaning pad has a predetermined configuration appropriate for the particular wire bonding machine and a substrate having a defined functionalized surface topology and geometry which can be introduced into the wire bonding machine during the normal wire bonding operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Application
    Filed: April 22, 2020
    Publication date: May 20, 2021
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles, Wayne C. Smith, Janakraj Shivlal
  • Publication number: 20210151317
    Abstract: A cleaning material, device, and method for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, in which the cleaning pad has a predetermined configuration appropriate for the particular pin contact elements and a substrate having a defined functionalized surface topology and geometry which can be introduced into the testing apparatus during the normal testing operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Application
    Filed: November 14, 2019
    Publication date: May 20, 2021
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles