Patents by Inventor Alex S. Redner

Alex S. Redner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring the optical quality of a reflective surface
    Patent number: 6985231
    Abstract: A method and apparatus for inspecting the optical quality of a reflective surface providing for the reflecting of a beam of light off the reflective surface, measuring an intensity of the reflected light at a first distance from said reflective surface, measuring an intensity of the reflected light at a second distance from said reflective surface, and comparing the intensity of the light measured at the two distances to determine the distortion of the reflective surface.
    Type: Grant
    Filed: September 20, 2002
    Date of Patent: January 10, 2006
    Assignee: Strainoptics, Inc.
    Inventor: Alex S. Redner
  • Method and apparatus for measuring the optical quality of a reflective surface
    Publication number: 20030053066
    Abstract: A method and apparatus for inspecting the optical quality of a reflective surface providing for the reflecting of a beam of light off the reflective surface, measuring an intensity of the reflected light at a first distance from said reflective surface, measuring an intensity of the reflected light at a second distance from said reflective surface, and comparing the intensity of the light measured at the two distances to determine the distortion of the reflective surface.
    Type: Application
    Filed: September 20, 2002
    Publication date: March 20, 2003
    Inventor: Alex S. Redner