Abstract: A probe (1) for electron microscopy is cut from a solid material. A sample surface (3) is configured on the same, which is treated with an ion beam (J) at a predetermined angle of incidence such that the material is ablated from the sample surface (3) by means of etching until the desired observation surface (20) is exposed on the sample (1) in the region of the incidence zone (4) of the ion beam (J), which enables the viewing (12) of the desired region of the sample (1) using an electron microscope. For this purpose, at least two stationary ion beams (J1, J2) are guided onto the sample surface (3) at a predetermined angle (?) in alignment with each other such that the ion beams (J1, J2) at least come in contact with each other on the sample surface (3), or cross each other, and form an incidence zone (4) in that location, and that both the sample (1) and the ion beams (J1, J2) are not moved, and thus are operated in a stationary manner.

Abstract: A probe (1) for electron microscopy is cut from a solid material. A sample surface (3) is configured on the same, which is treated with an ion beam (J) at a predetermined angle of incidence such that the material is ablated from the sample surface (3) by means of etching until the desired observation surface (20) is exposed on the sample (1) in the region of the incidence zone (4) of the ion beam (J), which enables the viewing (12) of the desired region of the sample (1) using an electron microscope.

Abstract: TEM samples are cut from a solid state material with length (l) and width (b) and with a front-side sample surface (7) onto which a curable adhesive of the flowable type is applied for fixing a fiber (2) with a diameter (d) aligned on the sample surface (7) in the longitudinal direction of the sample substantially centrally with respect to the width (b), with the adhesive (3) applied substantially over the entire area on the sample surface (7) and the fiber (2) aligning itself upon being placed onto the adhesive (3) and being wetted essentially along its entire length with the adhesive and the latter subsequently being cured. A simple and economical preparation of TEM samples with high quality is thereby made possible.