Patents by Inventor Alex Wayne Reed

Alex Wayne Reed has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Characterization of polymer and colloid solutions
    Patent number: 9664608
    Abstract: Simultaneous Multiple Sample Light Scattering systems and methods can be used for polymer stability testing and for applying stressors to polymer or colloid solutions including heat stress, ultrasound, freeze/thaw cycles, shear stress and exposure to different substances and surfaces, among others, that create a polymer stress response used to characterize the polymer solution and stability.
    Type: Grant
    Filed: August 20, 2014
    Date of Patent: May 30, 2017
    Assignees: ADVANCED POLYMER MONITORING TECHNOLOGIES, INC., THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
    Inventors: Wayne Frederick Reed, Michael Felix Drenski, Alex Wayne Reed
  • CHARACTERIZATION OF POLYMER AND COLLOID SOLUTIONS
    Publication number: 20150056710
    Abstract: Simultaneous Multiple Sample Light Scattering systems and methods can be used to for polymer stability testing and for applying stressors to polymer or colloid solutions including heat stress, ultrasound, freeze/thaw cycles, shear stress and exposure to different substances and surfaces. among others, that create a polymer stress response used to characterize the polymer solution and stability.
    Type: Application
    Filed: August 20, 2014
    Publication date: February 26, 2015
    Applicants: ADVANCED POLYMER MONITORING TECHNOLOGIES, INC., THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
    Inventors: Wayne Frederick Reed, Michael Felix Drenski, Alex Wayne Reed