Patents by Inventor Alexander David McKendrick

Alexander David McKendrick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11353342
    Abstract: A shadow-cast encoder apparatus includes a scale and a readhead. The readhead includes at least one electromagnetic radiation source for illuminating the scale in order to produce a shadow-cast fringe pattern at a detector configured to detect the shadow-cast fringe pattern. The encoder apparatus can be configured so as to suppress the total harmonic distortion of the fringe pattern, e.g. such that the total harmonic distortion of the fringe pattern is not more than 6%.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: June 7, 2022
    Assignee: RENISHAW PLC
    Inventor: Alexander David McKendrick
  • Publication number: 20210199473
    Abstract: An incremental measurement encoder including a scale and a readhead. The scale includes a periodic series of features forming an incremental track and at least one reference mark. The readhead including a structured light source and a reference mark photodetector array. The at least one reference mark can include at least one imaging element configured to form an image of the structured light source onto the reference mark photodetector array.
    Type: Application
    Filed: September 10, 2019
    Publication date: July 1, 2021
    Applicant: RENISHAW PLC
    Inventor: Alexander David McKENDRICK
  • Publication number: 20200011712
    Abstract: A shadow-cast encoder apparatus includes a scale and a readhead. The readhead includes at least one electromagnetic radiation source for illuminating the scale in order to produce a shadow-cast fringe pattern at a detector configured to detect the shadow-cast fringe pattern. The encoder apparatus can be configured so as to suppress the total harmonic distortion of the fringe pattern, e.g. such that the total harmonic distortion of the fringe pattern is not more than 6%.
    Type: Application
    Filed: March 6, 2018
    Publication date: January 9, 2020
    Applicant: RENISHAW PLC
    Inventor: Alexander David MCKENDRICK
  • Patent number: 9618329
    Abstract: An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.
    Type: Grant
    Filed: May 19, 2009
    Date of Patent: April 11, 2017
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Alexander David McKendrick
  • Publication number: 20120072170
    Abstract: A method of operating a vision measurement probe for obtaining and supplying images of an object to be measured. The vision measurement probe is mounted on a continuous articulating head of a coordinate positioning apparatus, and the continuous articulating head having at least one rotational axis. The object and vision measurement probe can be moved relative to each other about the at least one rotational axis and in at least one linear degree of freedom during a measuring operation. The method includes: processing at least one image obtained by the vision measurement probe to obtain feedback data; and controlling the physical relationship between the vision measurement probe and the object based on said feedback data.
    Type: Application
    Filed: June 4, 2010
    Publication date: March 22, 2012
    Applicant: RENISHAW PLC
    Inventors: Alexander David McKendrick, Ian William McLean, Calum Conner McLean, Nicholas John Weston, Timothy Charles Featherstone
  • Publication number: 20110058159
    Abstract: An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.
    Type: Application
    Filed: May 19, 2009
    Publication date: March 10, 2011
    Applicant: RENISHAW PLC
    Inventors: Nicholas John Weston, Alexander David McKendrick
  • Publication number: 20100072456
    Abstract: A read head for a scale reading apparatus, the head including a light source and an array of photodetector elements, wherein said light source and array of photodetector elements are fabricated in a lattice matched semiconductor compound.
    Type: Application
    Filed: October 29, 2007
    Publication date: March 25, 2010
    Applicant: RENISHAW PLC
    Inventors: Nicholas John Weston, Alexander David McKendrick, John Peter Carr, Marc Philippe Yves Desmulliez, Geoffrey McFarland