Patents by Inventor Alexander Dikopoltsev
Alexander Dikopoltsev has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240077435Abstract: A method for evaluating a sample that includes an array of structural elements. The method includes obtaining a first small angle x-ray scattering (SAXS) pattern for a first angular relationship between the sample and an x-ray beam that exhibits a first collimation value and has a given cross-sectional area on a first side of the sample. A second SAXS pattern is obtained for a second angular relationship between the sample and the x-ray beam, while the x-ray beam exhibits a second collimation value that differs from the first collimation value while maintaining the given cross-sectional area of the x-ray beam on the first side of the sample, wherein the second angular relationship differs from the first angular relationship.Type: ApplicationFiled: April 27, 2023Publication date: March 7, 2024Inventors: Alex Dikopoltsev, Matthew Wormington, Yuri Vinshtein, Alexander Krokhmal
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Publication number: 20230223735Abstract: A laser source is presented a plurality of unit cells of a selected number of partially physically coupled lasing units arranged within a plane and configured to form a topological structure, wherein each of the lasing units is configured to emit radiation component substantially perpendicular to said plane, said plurality of the unit cells comprising at least a first sub-array of the unit cells located in a first region interfacing with a second region of a different type than said first region, thereby defining an arrangement of optically coupled lasing units along an interface region between the first and second adjacent regions, forming at least one topological state along a topological path within said interface region.Type: ApplicationFiled: April 27, 2021Publication date: July 13, 2023Inventors: Mordechai SEGEV, Sven HOFLING, Sebastian KLEMBT, Alexander DIKOPOLTSEV, Tristan HARDER, Eran LUSTIG, Yaakov LUMER
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Patent number: 6895071Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: GrantFiled: August 6, 2003Date of Patent: May 17, 2005Assignee: Jordon Valley Applied Radiation, Ltd.Inventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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Patent number: 6895075Abstract: Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.Type: GrantFiled: February 12, 2003Date of Patent: May 17, 2005Assignee: Jordan Valley Applied Radiation Ltd.Inventors: Boris Yokhin, Alexander Dikopoltsev, Tzachi Rafaeli, Amos Gvirtzman
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Publication number: 20040156474Abstract: Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.Type: ApplicationFiled: February 12, 2003Publication date: August 12, 2004Applicant: JORDAN VALLEY APPLIED RADIATION LTD.Inventors: Boris Yokhin, Alexander Dikopoltsev, Tzachi Rafaeli, Amos Gvirtzman
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Publication number: 20040028186Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: ApplicationFiled: August 6, 2003Publication date: February 12, 2004Inventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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Patent number: 6639968Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: GrantFiled: November 20, 2002Date of Patent: October 28, 2003Assignee: Jordan Valley Applied Radiation, Ltd.Inventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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Publication number: 20030072413Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: ApplicationFiled: November 20, 2002Publication date: April 17, 2003Inventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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Patent number: 6512814Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: GrantFiled: April 12, 2001Date of Patent: January 28, 2003Assignee: Jordan Valley Applied RadiationInventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman
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Publication number: 20020150208Abstract: Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.Type: ApplicationFiled: April 12, 2001Publication date: October 17, 2002Inventors: Boris Yokhin, Alexander Dikopoltsev, Isaac Mazor, David Berman