Abstract: The present invention relates to an optical device for examining an object (16), comprising: a housing (24); an optical unit (26), arranged in the housing (24), for incident light; a sensor unit (28) having at least one image sensor (30, 32) arranged in the housing (24); a data processing unit (34) which is coupled to the sensor unit (28) and evaluates image signals from the at least one image sensor (30, 32); an illumination unit (42), arranged at least partially on or in the housing (24), for emitting grid light toward the object (16), wherein: by means of grid light reflected by the object (16) and reference light inside the housing, a three-dimensional point grid and associated reference datasets indicative of lateral information and depth information are provided using digital optical holography; by means of the device (10; 100; 120; 140), a relative movement of the device (10; 100; 120; 140) and the objective (16) is sensed, and associated movement information in the lateral and/or depth direction is cr

Abstract: The invention relates to an optical Spectroscopy apparatus.

Abstract: The invention relates to an optical system for generating a two- or three-dimensional image, the system comprising: a projection apparatus for optically transmitting image information to at least one user; an eye detection apparatus; and an imaging apparatus for imaging the image information of the projection device, so that the user can perceive said image information. The imaging apparatus comprises at least one optical hologram set, at least one of which sets is designed to be angle-amplifying.

Abstract: A device for determining a 3D structure of an object having first and second laser emitters which generate laser radiation with first and second different wavelengths, respectively. A first beam splitter splits the laser radiation of each laser emitter into reference and illuminating radiation. The illuminating radiation is adapted to impinge on the object to be measured, be reflected by the object as object radiation, and interfere with the reference radiation to form interference patterns. A detector receives the interference patterns. A selection hologram deflects object radiation which impinges on it within a predefined incidence angle range and passes object radiation which impinges on it outside of the incidence angle range undiffracted. The undiffracted radiation either passes by the determination area of the detector or impinges on the determination area at an angle outside the determination angle range.

Abstract: The invention relates to an optical system for generating a two- or three-dimensional image, the system comprising: a projection apparatus for optically transmitting image information to at least one user; an eye detection apparatus; and an imaging apparatus for imaging the image information of the projection device, so that the user can perceive said image information. The imaging apparatus comprises at least one optical hologram set, at least one of which sets is designed to be angle-amplifying.

Abstract: Apparatus for detecting a 3D structure of an object, comprising at least three laser emitters and a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation. The illumination radiation strikes the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns formed from the interference of the reference and object radiation and an analysis unit analyzes the interference patterns. At least two of the laser emitters emit laser radiation in the invisible range and the analysis unit detects the object in three dimensions based on the interference patterns of the invisible laser radiation. At least one of the laser emitters emits colored laser radiation and the analysis unit deduces the object's color based on the intensity of the colored object radiation reflected by the object.

Abstract: A device for determining a 3D structure of an object having first and second laser emitters which generate laser radiation with first and second different wavelengths, respectively. A first beam splitter splits the laser radiation of each laser emitter into reference and illuminating radiation. The illuminating radiation is adapted to impinge on the object to be measured, be reflected by the object as object radiation, and interfere with the reference radiation to form interference patterns. A detector receives the interference patterns. A selection hologram deflects object radiation which impinges on it within a predefined incidence angle range and passes object radiation which impinges on it outside of the incidence angle range undiffracted. The undiffracted radiation either passes by the determination area of the detector or impinges on the determination area at an angle outside the determination angle range.

Abstract: An apparatus for detecting a 3D structure of an object. The apparatus has first and second laser emitters which generate laser radiation having first and second wavelengths, respectively, the first wavelength being different from the second wavelength. Optical devices are disclosed, including a beam splitter, which splits the laser radiation of the laser emitters in each case into a reference radiation and an illuminating radiation. The illuminating radiation impinges upon the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns. The laser emitters are located such that the illuminating radiation of the first and second laser emitters impinge upon the object at different angles of incidence. Also discussed is a measuring device which measures the two wavelengths of the laser radiation of the laser emitters and influences the recording of the interference patterns.

Abstract: Apparatus for detecting a 3D structure of an object, comprising at least three laser emitters and a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation. The illumination radiation strikes the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns formed from the interference of the reference and object radiation and an analysis unit analyzes the interference patterns. At least two of the laser emitters emit laser radiation in the invisible range and the analysis unit detects the object in three dimensions based on the interference patterns of the invisible laser radiation. At least one of the laser emitters emits colored laser radiation and the analysis unit deduces the object's color based on the intensity of the colored object radiation reflected by the object.

Abstract: An apparatus for detecting a 3D structure of an object. The apparatus has first and second laser emitters which generate laser radiation having first and second wavelengths, respectively, the first wavelength being different from the second wavelength. Optical devices are disclosed, including a beam splitter, which splits the laser radiation of the laser emitters in each case into a reference radiation and an illuminating radiation. The illuminating radiation impinges upon the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns. The laser emitters are located such that the illuminating radiation of the first and second laser emitters impinge upon the object at different angles of incidence. Also discussed is a measuring device which measures the two wavelengths of the laser radiation of the laser emitters and influences the recording of the interference patterns.

Abstract: The invention relates to a position detection system for the contactless interferometric detection of the location of a target object. A target object unit comprises a reference light transmitter, which is configured such that it transmits a reference light beam having curved light wave fronts. The target object unit comprises at least one detector array having a plurality of detector pixels, which is fixed to the target object unit such that the reference light beam of the reference light transmitter impinges on the same.

Abstract: A scanning sensor system for noncontact optical scanning of object surfaces having a sensor head (2) and an optics unit (3) as system components matched to one another. The optics unit (3) can be attached and positioned with high precision on the sensor head (2) by means of a fixing device (4).

Abstract: Scanning system for scanning the surface (13, 14) of an object, in particular for a coordinates measurement machine. A scan sensor (1) comprises at least one fluid-mounted light transport module (2), a fluid being located between the light transport module (2) and a bearing part (3) in a bearing gap (7), by means of which fluid the light transport module (2) is mounted in such a manner that it is movable both axially and also rotating in relation to the axis of the cylindrical external wall. Primary light originating from a light source is transported through the interior (8) of the light transport module (2) to a primary exit point (12a, 12b) distal in the axial direction, from which it is emitted in the direction toward the object surface (13, 14). Secondary light reflected from the object surface (13, 14) is also transported through the interior (8) of the light transport module (2) to a secondary light exit point (17) distal in the axial direction from the secondary light entry point (16a, 16b).

Abstract: The invention relates to a position detection system for the contactless interferometric detection of the location of a target object. A target object unit comprises a reference light transmitter, which is configured such that it transmits a reference light beam having curved light wave fronts. The target object unit comprises at least one detector array having a plurality of detector pixels, which is fixed to the target object unit such that the reference light beam of the reference light transmitter impinges on the same.

Abstract: A scanning sensor system for noncontact optical scanning of object surfaces having a sensor head (2) and an optics unit (3) as system components matched to one another. The optics unit (3) can be attached and positioned with high precision on the sensor head (2) by means of a fixing device (4). The fixing device (4) has three bearings (20, 21, 22), on which an optics unit (3) pressed against the sensor head (2) is borne and thereby positioned. Each of the three bearings (20, 21, 22) has a pair of bearing parts (17a, 17b; 18a, 18b; 19a, 19b) matched to one another in respect of their shape and positioning, these bearing parts having bearing surfaces in which respectively one of the bearing parts (17a, 18a, 19a) of the bearing part pairs is in contact with at least one bearing surface of the other bearing part (17b, 18b, 19b) of the bearing part pair.

Abstract: Low-coherence interferometric apparatus for light-optical scanning of an object (18) with a low-coherence interferometer (6) comprising a low-coherent light source (7), a reference reflector (21) and a detector (25), wherein light emitted by the light source (7) is split into two optical paths (11,12), a first fraction of the light being irradiated as measurement light (16) onto the object and a second fraction of the light being irradiated as reference light (22) upon the reference reflector (21), and wherein, after reflection on the object (18) or the reference reflector (21) respectively, the measurement light (16) and the reference light (22) are combined at a beam junction (10) in such a manner that an interference signal which contains information about the reflection intensity of the measurement light, relative to the respective scan position is generated.

Abstract: Low-coherence interferometric device for light optical depth scanning of an object (13) positioned in front of a measurement aperture (12) of the device by detecting the position of light-reflecting sites which are located at different measurement depths within the object (13) along a scanning path (19) running into the object in a scanning direction (25) using a low-coherence interferometer which comprises a low-coherence light source (7), a beam splitter (8), a reference reflector (9) and a detector (10). The interferometer is a free-space in-line interferometer (6) having a beam splitter (8) running transversal to the direction of scanning (25). The light transmitter (7), the detector (10) and the reference mirror (9) are arranged on the side of the beam splitter facing away from the measurement aperture. A movable scanning lens (11) is arranged between the beam splitter (8) and the measurement aperture (12).

Abstract: Low coherence interferometer apparatus for investigation of a sample (15), in particular for multi-dimensional imaging, having an interferometer configuration (2) comprising a low coherence light source, a probe head (9) having a light exit opening (16) for irradiating light into the sample, an optical coupler, a reference reflector and a detector (13). The optical paths between the elements of the interferometer configuration (2) form interferometer arms. The optical coupler and the reference arm of the interferometer configuration (2) are integrated into a common optical chip (28). In addition to the reference reflector (11), the reference arm comprises a deflection reflector (33) formed on an end surface (35) of the optical chip (28) in such a manner that the reference light is cross-coupled between a first light guide (10a) forming a first portion of the reference arm (10) and a second light guide (10b) forming a second portion of the reference arm (10).

Abstract: Low coherence interferometer apparatus for investigation of a sample (15), in particular for multidimensional imaging, having an interferometer configuration (2) comprising a low coherence light source, a probe head (9) having a light exit opening (16) for irradiating light into the sample, an optical coupler, a reference reflector and a detector (13). The optical paths between the elements of the interferometer configuration (2) form interferometer arms. The optical coupler and the reference arm of the interferometer configuration (2) are integrated into a common optical chip (28). In addition to the reference reflector (11), the reference arm comprises a deflection reflector (33) formed on an end surface (35) of the optical chip (28) in such a manner that the reference light is cross-coupled between a first light guide (10a) forming a first portion of the reference arm (10) and a second light guide (10b) forming a second portion of the reference arm (10).

Abstract: Method for determining an analyte in a scattering matrix. In a detection step detection measurements are made in which light is irradiated into the matrix as primary light and light leaving the scattering matrix is detected as secondary light, in order to determine as a measurement quantity a measurable physical property of the light which is variable due to the interaction of the light with the matrix. Information on the presence of the analyte in the matrix is determined in an evaluation step. The determination of optically weakly absorbing analytes against a strongly absorbing interference background is improved by the use of two selection methods for the depth selective detection of the secondary light in combination with one another.