Abstract: An electrical measuring system of a six-port circuit includes a delay line and a arithmetic unit. In a first operating mode, an electrical signal can be on the one hand transmitted directly to a first input terminal and on the other hand via the delay line to a second input terminal of the six-port circuit. In an embodiment, the measuring system is configured such that, in the second operating mode, it does not supply a signal to the first input terminal of the six-port circuit and it supplies a reference signal to the second input terminal of the six-port circuit.

Abstract: An electrical measuring system of a six-port circuit includes a delay line and a arithmetic unit. In a first operating mode, an electrical signal can be on the one hand transmitted directly to a first input terminal and on the other hand via the delay line to a second input terminal of the six-port circuit. In an embodiment, the measuring system is configured such that, in the second operating mode, it does not supply a signal to the first input terminal of the six-port circuit and it supplies a reference signal to the second input terminal of the six-port circuit.

Abstract: In accordance with one embodiment, a method for testing a plurality of electronic components is provided, including subdividing the plurality of electronic components into a plurality of first groups and subdividing the plurality of electronic components into a plurality of second groups. The method may further include measuring, for each first group, an electrical parameter of an interconnection of the components of the first group; measuring, for each second group, an electrical parameter of an interconnection of the components of the second group, and determining which electronic components of the plurality of electronic components have a predefined property, on the basis of the result of the measurement of the electrical parameter for the first groups and on the basis of the result of the measurement of the electrical parameter for the second groups.

Abstract: In accordance with one embodiment, a method for testing a plurality of electronic components is provided, including subdividing the plurality of electronic components into a plurality of first groups and subdividing the plurality of electronic components into a plurality of second groups. The method may further include measuring, for each first group, an electrical parameter of an interconnection of the components of the first group; measuring, for each second group, an electrical parameter of an interconnection of the components of the second group, and determining which electronic components of the plurality of electronic components have a predefined property, on the basis of the result of the measurement of the electrical parameter for the first groups and on the basis of the result of the measurement of the electrical parameter for the second groups.