Patents by Inventor Alexander Krohmal

Alexander Krohmal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High-resolution X-ray diffraction measurement with enhanced sensitivity
    Patent number: 8731138
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.
    Type: Grant
    Filed: July 12, 2012
    Date of Patent: May 20, 2014
    Assignee: Jordan Valley Semiconductor Ltd.
    Inventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman, Matthew Wormington
  • X-ray detector assembly with shield
    Patent number: 8693635
    Abstract: An X-ray detector assembly includes an integrated circuit, which includes an array of detector elements and a readout circuit adjacent to the array and coupled to read charge out of the detector elements. A non-metallic shield is positioned over the readout circuit so as to prevent X-rays from striking the readout circuit.
    Type: Grant
    Filed: June 9, 2013
    Date of Patent: April 8, 2014
    Assignee: Jordan Valley Semiconductor Ltd.
    Inventor: Alexander Krohmal
  • Enhancing accuracy of fast high-resolution X-ray diffractometry
    Patent number: 8687766
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum of the sample. The diffraction spectrum is corrected to compensate for a non-uniform property of the converging beam.
    Type: Grant
    Filed: July 12, 2011
    Date of Patent: April 1, 2014
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventors: Matthew Wormington, Alexander Krohmal, David Berman, Gennady Openganden
  • X-RAY DETECTOR ASSEMBLY WITH SHIELD
    Publication number: 20130270447
    Abstract: An X-ray detector assembly includes an integrated circuit, which includes an array of detector elements and a readout circuit adjacent to the array and coupled to read charge out of the detector elements. A non-metallic shield is positioned over the readout circuit so as to prevent X-rays from striking the readout circuit.
    Type: Application
    Filed: June 9, 2013
    Publication date: October 17, 2013
    Inventor: Alexander Krohmal
  • High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity
    Publication number: 20120281814
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.
    Type: Application
    Filed: July 12, 2012
    Publication date: November 8, 2012
    Applicant: JORDAN VALLEY SEMICONDUCTORS LTD
    Inventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman, Matthew Wormington
  • High-resolution X-ray diffraction measurement with enhanced sensitivity
    Patent number: 8243878
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.
    Type: Grant
    Filed: January 7, 2010
    Date of Patent: August 14, 2012
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Openganden, David Berman, Matthew Wormington
  • ENHANCING ACCURACY OF FAST HIGH-RESOLUTION X-RAY DIFFRACTOMETRY
    Publication number: 20120014508
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum of the sample. The diffraction spectrum is corrected to compensate for a non-uniform property of the converging beam.
    Type: Application
    Filed: July 12, 2011
    Publication date: January 19, 2012
    Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.
    Inventors: Matthew Wormington, Alexander Krohmal, David Berman, Gennady Openganden
  • High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity
    Publication number: 20110164730
    Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.
    Type: Application
    Filed: January 7, 2010
    Publication date: July 7, 2011
    Applicant: JORDAN VALLEY SEMICONDUCTORS LTD
    Inventors: Boris Yokhin, Isaac Mazor, Alexander Krohmal, Amos Gvirtzman, Gennady Ofengenden, David Berman, Matthew Wormington