Abstract: In some embodiments, a measurement system may include a time to digital converter (TDC) configured to determine a first digitized time at which it receives a command signal and a second digitized time at which it receives an alert signal. The first digitized time and the second digitized time may be determined for N number of iterations. The command signal may be delayed by a delay time, and the delay time may be varied for each of the N number of iterations. The measurement system may include a first dynamic photodiode (DPD) configured to switch from a reverse bias mode to an active mode based on the command signal. The TDC may calculate a difference between the first digitized time and the second digitized time for each of the N number of iterations, and the difference may vary as the delay time is varied.

Abstract: According to embodiments of the present disclosure, a dynamic photodiode may include a substrate, a first doped region, a second doped region, a first resettable doped region between the first doped region and the second doped region, and a first light absorbing region between the first doped region and the second doped region. The first doped region may include a first contact that receives a first voltage. The second doped region may include a second contact that receives a second voltage. The first resettable doped region may include a first resettable contact that receives a reset voltage or is set as an open circuit. The first light absorbing region may generate first electron-hole pairs in the substrate when the first resettable contact is set as an open circuit, and the first electron-hole pairs may be removed from the substrate when the first resettable contact receives the reset voltage.

Abstract: In some embodiments, a measurement system may include a time to digital converter (TDC) configured to determine a first digitized time at which it receives a command signal and a second digitized time at which it receives an alert signal. The first digitized time and the second digitized time may be determined for N number of iterations. The command signal may be delayed by a delay time, and the delay time may be varied for each of the N number of iterations. The measurement system may include a first dynamic photodiode (DPD) configured to switch from a reverse bias mode to an active mode based on the command signal. The TDC may calculate a difference between the first digitized time and the second digitized time for each of the N number of iterations, and the difference may vary as the delay time is varied.

Abstract: According to embodiments of the present disclosure, a dynamic photodiode may include a substrate, a first doped region, a second doped region, a first resettable doped region between the first doped region and the second doped region, and a first light absorbing region between the first doped region and the second doped region. The first doped region may include a first contact that receives a first voltage. The second doped region may include a second contact that receives a second voltage. The first resettable doped region may include a first resettable contact that receives a reset voltage or is set as an open circuit. The first light absorbing region may generate first electron-hole pairs in the substrate when the first resettable contact is set as an open circuit, and the first electron-hole pairs may be removed from the substrate when the first resettable contact receives the reset voltage.