Abstract: Disclosed herein are systems for imaging and ablating a sample. An imaging/ablating device (110) includes an optical assembly (112), a sample stage (114), and a receiver (116). The optical assembly (112) is disposed in an inverted position below the sample stage (114) and the receiver (116) is positioned above the sample stage (112). The optical assembly enables imaging of a sample disposed on the sample stage (114). The optical assembly (112) also enables ablation of a region of interest within the sample. The laser light propagated from the optical assembly during ablation propagates substantially in the same direction as the direction of travel of the ablation plume (20) toward the receiver (116).

Abstract: In an example, a system includes a sample transfer assembly configured to convey ablated material from a sample to an analyzer inlet of an ion analyzer. The sample transfer assembly includes a sample transfer pipe and one or more gas inlets, each configured to receive a respective gas flow. A mass flow rate into the analyzer inlet is equal to or greater than a total mass flow rate of the gas flows into the one or more gas inlets. In another example, a method includes entraining ablated material in a sample material flow that flows within a sample transfer assembly, ionizing the ablated material, and conveying the ionized sample particles to an analyzer inlet of an ion analyzer. In another example, a computer-readable medium includes stored processor-executable instructions that, when executed by a processor, cause the processor to regulate a flow rate of a sample material flow.

Abstract: An analytical instrument comprises an ion mobility separator, a mass filter downstream of the ion mobility separator, and a mass analyser downstream of the mass filter. The ion mobility separator performs ion mobility separation scans to separate ions according to ion mobility. The mass filter filters the separated ions using an isolation window, and during each scan: (i) scanning a centre mass to charge ratio (m/z) of the isolation window, and (ii) controlling a width ?mz of the isolation window such that ions emerging from the ion mobility separator within an ion mobility arrival time range ?T are transmitted by the mass filter. The mass analyser performs mass analysis scan(s) during each ion mobility separation scan in which the mass analyser analyses ions transmitted by or derived from ions transmitted by the mass filter, each mass analysis scan having a duration T, and wherein ?T<T.

Abstract: A mass spectrometer ion transport system comprises: (a) an ion transfer tube for receiving ions from an atmospheric pressure ionization ion source and comprising an ion outlet end; (b) an apparatus comprising: a first electrode section comprising a first ion transport volume and configured to receive the ions from the ion outlet end of the ion transfer tube; an ion funnel comprising an ion inlet aperture configured to receive the ions from the first electrode section, a second ion transport volume, and an ion outlet aperture configured to transfer the ions from the second ion transport volume to a mass analyzer, and (c) an auxiliary tube for delivering an auxiliary flow of gas into the first electrode section; wherein the ion funnel ion inlet aperture is offset from a linear axis defined between the ion transfer tube ion outlet end and the ion funnel ion outlet aperture.

Abstract: An ion guide may comprise a set of plate electrodes, each plate electrode having a plurality of apertures formed therethrough. The set of plate electrodes are spatially arranged such that a relative positioning of each plurality of apertures of a respective plate electrode of the set of plate electrodes and respective adjacent plate electrodes of the set of plate electrodes defines a continuous ion flight path through the respective plurality of apertures of each plate electrode of the set of plate electrodes. The continuous ion flight path has a helical-based and/or spiral-based shape.

Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.

Abstract: A method of operating a multipole device comprises sorting a list of mass-to-charge ratios that are assigned to one of first and second polarity configurations to be applied between first and second pairs of opposing electrodes, the first polarity configuration being a first polarity DC offset and the second polarity configuration being a second, opposite polarity DC offset; and based on the sorting, operating the multipole device for a first time duration according to the first polarity configuration to select ions having mass-to-charge ratios from the list that are assigned to the first polarity configuration and operating the multipole device for a second, distinct time duration according to the second polarity configuration to select ions having mass-to-charge ratios from the list that are assigned to the second polarity configuration.

Abstract: Methods for reducing charge on a contaminated surface of an ion optical system having a layer of charged contaminant thereon comprise generating charged particles by exciting a radiation source that is distinct from the contaminated surface and neutralising at least a portion of the layer of charged contaminant by causing the charged particles to interact with the layer of charged contaminant. The radiation source comprises an electromagnetic radiation source that emits electromagnetic radiation, and generating the charged particles comprises causing the electromagnetic radiation to interact with the layer of charged contaminant and/or the ion optical system to generate the charged particles; and/or (ii) the radiation source comprises an electron source that emits free electrons. Ion optical systems are configured to reduce charge on a contaminated surface of the ion optical system.

Abstract: A method for calibrating a time-of-flight (ToF) mass analyser comprises an ion injection device and an ion mirror comprising a plurality of electrodes, comprising: applying a plurality of acceleration voltages to cause ions to exit the ion injection device; at each ion energy, measuring the resolving power of the mass analyser with a plurality of sets of electrode voltages applied to the electrodes by varying a first tuning parameter to a respective plurality of values, wherein the first tuning parameter parameterises the electrode voltages applied to the plurality of electrodes; determining maximising values of the first tuning parameter; identifying a point of inflection in the dependence of the maximising values of the first tuning parameter; determining a set of calibrated operating parameters for the massanalyser based on the point of inflection; and causing the mass analyser to operate with the calibrated operating parameters.

Abstract: A method of mass spectrometry is provided. The method comprises performing the following steps for each of a plurality of sub-ranges selected from an overall m/z range: accumulating in an ion store a sample of precursor ions to be analysed, the precursor ions having m/z values within the sub-range; accumulating in the ion store a sample of fragmented precursor ions to be analysed, the fragmented precursor ions being formed from fragmentation of precursor ions having m/z values within the sub-range; and simultaneously analysing the combined samples of the precursor ions and the fragmented precursor ions in a mass analyser.

Abstract: A method of determining a calibration for an analytical instrument comprises ionising a calibrant to produce calibrant ions, performing a sequence of ion separation scans, performing a plurality of mass analysis scans by performing one or more mass analysis scan(s) during each ion separation scan of the sequence, and using data obtained from the plurality of mass analysis scans to determine a calibration for the analytical instrument. Each ion separation scan has a duration TIMS, and each mass analysis scan has a duration TMA. Each ion separation scan has a respective start time ti0, and each mass analysis scan has a respective start time tijMA defined relative to the start time ti0 of the ion separation scan during which the mass analysis scan is performed. The start times tijMA of the plurality of mass analysis scans include start times separated by a delay time ?t, wherein ?t<min (TMA, TIMS).

Abstract: The present invention provides a mass spectrometer comprising a first ion trap, a second ion trap, a lens stack for directing ions from the first ion trap to the second ion trap and a housing. The first ion trap is arranged to form a linear or curved potential well and the second ion trap is an electrostatic ion trap, for example, an orbital ion trap, arranged to form an annular potential well. The mass spectrometer further comprises a unitary insert comprising a first cavity which holds the lens stack and a second cavity which holds the second ion trap, wherein the insert is inserted within the housing.

Abstract: Mass spectrometry systems for performing mass analysis on ion samples include a vacuum region comprising a mass analyser configured to provide a detection signal for the ion sample. A turbomolecular pump is configured to maintain the vacuum region at a vacuum pressure and a controller is configured to control the pressure within the mass analyser to control the rate of decay over time of the detection signal for the ion sample by: controlling a pumping speed of the turbomolecular pump. The turbomolecular pump can be configured to maintain the vacuum region at a first pressure when the mass analyser is being operated in a mass analysis mode of operation and a second pressure when the mass analyser is being operated in a collision cross section analysis mode of operation, wherein the second pressure is greater than the first pressure.

Abstract: A mass spectrometry method comprises: (1) introducing ions and gas into an first electrode section of an ion transport apparatus through a slot of an ion transfer tube, the ion tunnel section comprising a first longitudinal axis that is contained within a slot plane of the ion transfer tube, the first longitudinal axis not intersecting an outlet of the ion transfer tube, wherein the apparatus further comprises: (a) a second electrode section configured to receive the ions from the first electrode section and comprising a second longitudinal axis that is not coincident with the first longitudinal axis; and (b) an ion outlet aperture; (2) providing voltages to electrodes of the ion transport apparatus that urge the ions to migrate towards the first longitudinal axis within the first electrode section; and (3) exhausting gas through a port that is offset from the ion outlet aperture.

Abstract: An ion trap 1 comprises one ejection electrode 2 for ion trapping having an opening 4, through which ions in the ion trap 1 can be ejected in an ejection direction E and further electrodes 3 for ion trapping, wherein the ejection electrode 2 and the further electrodes 3 are elongated in a longitudinal direction L. The angle ? between the longitudinal direction L and the ejection direction E is nearly 90°. The ion trap 1 comprises a primary winding 5 connected to an RF power supply 6, a secondary winding 7 coupling with the primary winding 5 for transforming the RF voltage of the RF power supply 6 supplying the transformed RF signals to the ejection electrode 2 and secondary windings 7? coupling with the primary winding 5 for transforming the RF voltage of the RF power supply 6 supplying the transformed RF signals to the further electrodes 3.

Abstract: An ion repulsive surface comprises: a first plurality of elongated electrodes distributed along an axis, configured to receive a first RF voltage with an asymmetric waveform; and a second plurality of elongated electrodes distributed along the axis, the second plurality of electrodes being interleaved with the first plurality of electrodes and configured to receive a second RF voltage with an asymmetric waveform, having a different phase than the first RF voltage. The first and second pluralities of electrodes and first and second RF voltages are configured such that a strength of an electric field adjacent the ion repulsive surface is sufficient for ions to experience mobility variation. An ion optical device may be provided from such an ion repulsive surface, from which an ion optical system, ion optical interface, mass spectrometer and/or ion mobility spectrometer may be considered.

Abstract: An ion optical device comprises: first and second electrode arrangements, spatially separated from one another, for receiving ions and a gas and arranged to operate in a high gas pressure environment; and an RF voltage supply applying: a first RF voltage comprising one or more RF drive frequencies to the first electrode arrangement; and a second RF voltage of the one or more RF drive frequencies, having a different phase, to the second electrode arrangement, wherein the first and second RF voltages have an asymmetric waveform, the application of the first and second RF voltages to the first and second electrodes arrangements respectively causing the received ions to experience an electric field. The first and second electrode arrangements and the RF voltage supply are configured such that a strength of the electric field experienced by the received ions is sufficient for ions to experience mobility variation.

Abstract: A sample introduction system for a spectrometer comprises a desolvation region that receives or generates sample ions from a solvent matrix and removes at least some of the solvent matrix from the sample ions. A separation chamber downstream of the desolvation region has a separation chamber inlet communicating with the desolvation region, for receiving the desolvated sample ions along with non-ionised solvent and solvent ion vapours. The separation chamber has electrodes for generating an electric field within the separation chamber, defining a first flow path for sample ions between the separation chamber inlet and a separation chamber outlet. Unwanted solvent ions and non-ionised solvent vapours are directed away from the separation chamber outlet. The sample introduction system has a reaction chamber with an inlet communicating with the separation chamber outlet, for receiving the sample ions from the separation chamber and for decomposing the received ions into smaller products.

Abstract: The present invention provides a method of manufacturing an electrode arrangement that includes mechanically coupling an RF electrode to a dielectric material using a plurality of separators that are spaced apart such that a gap is defined between the RF electrode and the dielectric material, and cutting the RF electrode while the RF electrode is coupled to the dielectric material so as to reshape the RF electrode.

Abstract: An ion mobility analyser is disclosed having a gas flow directed along the ion travel axis and a set of electrodes to which DC voltages are applied to establish a DC field. The opposing forces of the gas flow and DC field cause ions to be trapped within a separation region in axial regions determined by their ion mobilities. A gas recirculator, having inlet and outlet ends respectively located downstream and upstream of the separation region, supplies at least fifty percent of the gas flow within the separation region, thereby reducing vacuum pumping requirements.