Patents by Inventor Alexander Puski

Alexander Puski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical measurement of thin films
    Patent number: 10209129
    Abstract: Embodiments of measurement apparatus for measuring the optical properties of a sample film are described. The measurement apparatus includes a first stage, a second stage, and an arm structure coupled to the second stage. The first stage includes an optical source and a block of transparent material. The block of transparent material includes a surface that supports a sample film. The second stage includes a plurality of layers and an optical detector. The arm structure is designed to translate the second stage with respect to the first stage.
    Type: Grant
    Filed: January 5, 2018
    Date of Patent: February 19, 2019
    Assignee: Nanosys, Inc.
    Inventors: Amanda Carpenter, Robert Wilson, Ernest C. Lee, Alexander Puski
  • Optical Measurement of Thin Films
    Publication number: 20180195901
    Abstract: Embodiments of measurement apparatus for measuring the optical properties of a sample film are described. The measurement apparatus includes a first stage, a second stage, and an arm structure coupled to the second stage. The first stage includes an optical source and a block of transparent material. The block of transparent material includes a surface that supports a sample film. The second stage includes a plurality of layers and an optical detector. The arm structure is designed to translate the second stage with respect to the first stage.
    Type: Application
    Filed: January 5, 2018
    Publication date: July 12, 2018
    Inventors: Amanda Carpenter, Robert Wilson, Ernest C. Lee, Alexander Puski