Patents by Inventor Alexander Ratner

Alexander Ratner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250036886
    Abstract: Using a large language model to comply with a user request. The large language model receives tool documentation for each of one or more tools, and analyzes the tool documentation for each of the one or more tools to determine, for each tool, one or more tasks that the tool is operable to perform. Upon receiving a request from a user, the large language model generates a plan for complying with the request by using one or more of the tools, the plan including performance of one or more of the tasks.
    Type: Application
    Filed: July 9, 2024
    Publication date: January 30, 2025
    Inventors: Chen-Yu Lee, Alexander Ratner, Tomas Pfister, Chun-Liang Li, Yasuhisa Fujii, Ranjay Krishna, Cheng-Yu Hsieh, Si-An Chen
  • Patent number: 7047796
    Abstract: The invention is directed to a scanned probe microscope including one plate allowing for tip scanning and the other allowing for sample scanning, with the optical axis of the scanned probe microscope being free to permit incorporation into standard optical microscopes. The top plate can be hinged onto the bottom plate, or the top plate can simply be placed on the bottom plate and a rough approach is caused by a dc motor or other mechanism which will enable the two flat plate scanners to have a large z range. In another embodiment, the microscope includes three plates which allow sample scanning, tip scanning and two tips to be operational at the same time. A microscope in accordance with the invention may use a liquid cell, may use a near-field optical element made of silicon cantilever technology, or may use an apertureless probe for apertureless near-field scanning optical microscopy.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: May 23, 2006
    Assignee: Nanonics Imaging, Ltd.
    Inventors: Aaron Lewis, Anatoly Komissar, Hisham Taha, Alexander Ratner
  • Publication number: 20040216518
    Abstract: The invention is directed to a scanned probe microscope including one plate allowing for tip scanning and the other allowing for sample scanning, with the optical axis of the scanned probe microscope being free to permit incorporation into standard optical microscopes. The top plate can be hinged onto the bottom plate, or the top plate can simply be placed on the bottom plate and a rough approach is caused by a dc motor or other mechanism which will enable the two flat plate scanners to have a large z range. In another embodiment, the microscope includes three plates which allow sample scanning, tip scanning and two tips to be operational at the same time.
    Type: Application
    Filed: February 23, 2004
    Publication date: November 4, 2004
    Inventors: Aaron Lewis, Anatoly Komissar, Hisham Taha, Alexander Ratner