Patents by Inventor Alexander Schindler
Alexander Schindler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11237123Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has a washer arrangement, which is inserted between the crucible and the sensor and which has a first layer, which contacts the crucible, of a first material and a second layer, which contacts the sensor, of a second material, which differs from the first material. The invention further includes a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: May 21, 2019Date of Patent: February 1, 2022Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143609Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has an outer crucible for storing the crucible in the outer crucible, wherein the crucible is made of a crucible material and the outer crucible of an outer crucible material, which differs from the crucible material. The invention further proses a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: GrantFiled: June 6, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Patent number: 11143608Abstract: A measuring arrangement and method for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To provide for a high level of reproducibility of measurements in the case of such a measuring arrangement and a method for the thermal analysis performed with the measuring arrangement, the measuring arrangement has an anti-rotation protection for the crucible, in order to provide a predetermined rotational position of the crucible with respect to the sensor when the crucible is arranged on the sensor. The invention includes a method for the thermal analysis of a sample, which is performed using such a measuring arrangement.Type: GrantFiled: June 3, 2019Date of Patent: October 12, 2021Assignee: NETZSCH-Gerätebau GmbHInventor: Alexander Schindler
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Publication number: 20190376914Abstract: A measuring arrangement and method for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To provide for a high level of reproducibility of measurements in the case of such a measuring arrangement and a method for the thermal analysis performed with the measuring arrangement, the measuring arrangement has an anti-rotation protection for the crucible, in order to provide a predetermined rotational position of the crucible with respect to the sensor when the crucible is arranged on the sensor. The invention includes a method for the thermal analysis of a sample, which is performed using such a measuring arrangement.Type: ApplicationFiled: June 3, 2019Publication date: December 12, 2019Inventor: Alexander Schindler
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Publication number: 20190376916Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has a washer arrangement, which is inserted between the crucible and the sensor and which has a first layer, which contacts the crucible, of a first material and a second layer, which contacts the sensor, of a second material, which differs from the first material. The invention further proses a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: ApplicationFiled: May 21, 2019Publication date: December 12, 2019Inventor: Alexander Schindler
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Publication number: 20190376915Abstract: A measuring arrangement for a thermal analysis of a sample, having a crucible for storing a sample in the crucible, as well as a sensor for measuring a sample temperature of the sample when the crucible is arranged on the sensor. To reduce the risk of damages to or even the destruction of used components as a result of chemical or physical reactions, it is provided according to the invention that the measuring arrangement further has an outer crucible for storing the crucible in the outer crucible, wherein the crucible is made of a crucible material and the outer crucible of an outer crucible material, which differs from the crucible material. The invention further proses a method for the thermal analysis of a sample, which is performed by using such a measuring arrangement.Type: ApplicationFiled: June 6, 2019Publication date: December 12, 2019Inventor: Alexander Schindler
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Patent number: 10302497Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.Type: GrantFiled: December 14, 2016Date of Patent: May 28, 2019Assignee: Netzsch-Gerätebau GmbHInventors: Martin Brunner, Alexander Schindler, André Lindemann
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Patent number: 10088441Abstract: Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.Type: GrantFiled: August 28, 2015Date of Patent: October 2, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, Andre Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Patent number: 9816869Abstract: A method for evaluating a measurement result of a thermal analysis. A program-controlled computer unit is used to calculate at least one probability of the agreement of the measurement result with at least one dataset previously stored in the computer unit, wherein this calculation is based on a comparison of effect data previously extracted from a measurement curve of the thermal analysis with corresponding stored effect data of the dataset. The evaluation can advantageously include, an automatic recognition and classification of measurement curves and can be carried out in particular more efficiently, more economically and more quickly than previously, with at the same time a high quality of evaluation.Type: GrantFiled: July 11, 2014Date of Patent: November 14, 2017Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Matthias Gradl, Gunther Herr, André Nijmeh, Stefan Schmoelzer, Markus Meyer
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Publication number: 20170176257Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.Type: ApplicationFiled: December 14, 2016Publication date: June 22, 2017Inventors: Martin Brunner, Alexander Schindler, André Lindemann
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Publication number: 20160325286Abstract: A method and a device for holding in readiness, transporting, processing and archiving thermoanalytical samples are disclosed. The sample containers, into which the thermoanalytical samples to be investigated are to be introduced, are provided in a magazine.Type: ApplicationFiled: June 23, 2016Publication date: November 10, 2016Inventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, André Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Patent number: 9429531Abstract: A device for thermal analysis. This device includes at least one thermoanalytical measurement device and at least one infrared spectrometer, wherein the infrared spectrometer is fully integrated into the thermoanalytical measurement device. The thermoanalytical measurement device and the at least one infrared spectrometer are connected to one another by a lift-swivel unit. The at least one infrared spectrometer is disposed above the thermoanalytical measurement device.Type: GrantFiled: June 13, 2013Date of Patent: August 30, 2016Assignee: Netzsch-Gerätebau GmbHInventors: Georg Neumann, Alexander Schindler, Juergen Blumm
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Patent number: 9310259Abstract: A method for conducting a differential thermal analysis, in which a sample disposed in a temperable sample space is tempered according to an essentially linear temperature program extending from a start temperature to an end temperature, such that, from the result of a measurement of the sample temperature conducted during tempering at a number of measurement time points, a DTA signal is calculated as the difference between a measured sample temperature and a reference temperature calculated according to a temperature curve model. According to the invention, for every measurement time point, the relevant reference temperature is calculated by the following steps: (a) establish a time interval containing the relevant measurement time point; (b) calculate a non-linear adjustment function for the measured sample temperature curve in the time interval; and (c) calculate the reference temperature as a value of the adjustment function for the measurement time point.Type: GrantFiled: January 24, 2014Date of Patent: April 12, 2016Assignee: Netzsch-Gerätebau GmbHInventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Mathias Gradl, Gunter Herr, Stephan Knappe, Markus Meyer, Gabriele Kaiser, Andre Nijmeh
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Publication number: 20150369765Abstract: Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.Type: ApplicationFiled: August 28, 2015Publication date: December 24, 2015Inventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, Andre Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Publication number: 20150013479Abstract: A method and a device for holding in readiness, transporting, processing and archiving thermoanalytical samples are disclosed. The sample containers, into which the thermoanalytical samples to be investigated are to be introduced, are provided in a magazine.Type: ApplicationFiled: July 3, 2014Publication date: January 15, 2015Inventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Matthias Gradl, Gunther Herr, Andre Nijmeh, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stefan Schmoelzer, Markus Meyer, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler
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Publication number: 20150019157Abstract: A method for evaluating a measurement result of a thermal analysis. A program-controlled computer unit is used to calculate at least one probability of the agreement of the measurement result with at least one dataset previously stored in the computer unit, wherein this calculation is based on a comparison of effect data previously extracted from a measurement curve of the thermal analysis with corresponding stored effect data of the dataset. The evaluation can advantageously include, an automatic recognition and classification of measurement curves and can be carried out in particular more efficiently, more economically and more quickly than previously, with at the same time a high quality of evaluation.Type: ApplicationFiled: July 11, 2014Publication date: January 15, 2015Inventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Gabriele Kaiser, Stephan Knappe, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Matthias Gradl, Gunther Herr, André Nijmeh, Stefan Schmoelzer, Markus Meyer
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Patent number: 8899827Abstract: A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.Type: GrantFiled: December 5, 2011Date of Patent: December 2, 2014Assignee: Netzsch-Gerätebau GmbHInventors: Alexander Schindler, Juergen Blumm
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Publication number: 20140204971Abstract: A method for conducting a differential thermal analysis, in which a sample disposed in a temperable sample space is tempered according to an essentially linear temperature program extending from a start temperature to an end temperature, such that, from the result of a measurement of the sample temperature conducted during tempering at a number of measurement time points, a DTA signal is calculated as the difference between a measured sample temperature and a reference temperature calculated according to a temperature curve model. According to the invention, for every measurement time point, the relevant reference temperature is calculated by the following steps: (a) establish a time interval containing the relevant measurement time point; (b) calculate a non-linear adjustment function for the measured sample temperature curve in the time interval; and (c) calculate the reference temperature as a value of the adjustment function for the measurement time point.Type: ApplicationFiled: January 24, 2014Publication date: July 24, 2014Inventors: Thomas Denner, Juergen Blumm, Otto Max Schaefer, Markus Hollering, Thilo Hilpert, Alexander Frenzl, Stefan Lauterbach, Andreas Strobel, Rolf Preuss, Michael Gebhardt, Elena Moukhina, Alexander Schindler, Mathias Gradl, Gunter Herr, Stephan Knappe, Markus Meyer, Gabriele Kaiser, Andre Nijmeth
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Publication number: 20130336355Abstract: A device for thermal analysis. This device includes at least one thermoanalytical measurement device and at least one infrared spectrometer, wherein the infrared spectrometer is fully integrated into the thermoanalytical measurement device. The thermoanalytical measurement device and the at least one infrared spectrometer are connected to one another by a lift-swivel unit. The at least one infrared spectrometer is disposed above the thermoanalytical measurement device.Type: ApplicationFiled: June 13, 2013Publication date: December 19, 2013Inventors: Georg Neumann, Alexander Schindler, Juergen Blumm
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Publication number: 20120096936Abstract: A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.Type: ApplicationFiled: December 5, 2011Publication date: April 26, 2012Inventors: Alexander Schindler, Juergen Blumm