Patents by Inventor Alexander Weigel
Alexander Weigel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12586977Abstract: A laser pulse sequence measuring method for measuring a delay between a pair of pulses from two laser pulse sequences (1, 2), comprises the steps of creating a first laser pulse sequence (1) of first laser pulses (1A) and a second laser pulse sequence (2) of second laser pulses (2A), and generating a delay signal (3) which represents the delay between the pair of pulses from the first and second laser pulse sequences (1, 2), wherein the step of generating the delay signal (3) includes creating intra-pulse difference frequency generation (IPDFG) pulses (4) by applying intra-pulse difference frequency generation to the first laser pulses (1A) in a difference frequency generation (DFG) medium (21), providing phase-stable reference waveforms (5) based on the IPDFG pulses (4), and electro-optic sampling (EOS) of the electric field of the phase-stable reference waveforms (5) with sampling pulses (6) in an EOS medium (22), wherein the sampling pulses (6) are created based on the second laser pulses (2A), for generatType: GrantFiled: December 22, 2020Date of Patent: March 24, 2026Assignees: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V., Ludwig-Maximilians-Universitaet MuenchenInventors: Alexander Weigel, Theresa Buberl, Ferenc Krausz, Ioachim Pupeza
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Patent number: 12586972Abstract: A laser system generates laser pulses having a determined carrier-envelope-offset, CEO. The laser system includes a Cr-doped II-VI based laser oscillator system having a resonator cavity, which emits laser pulses having a peak power of at least 0.75 MW. The laser system further includes a nonlinear optical element for spectrally broadening at least a part of the emitted laser pulses irradiated onto the nonlinear optical element to provide the laser pulses with octave-spanning spectral components, and a frequency-doubling element for generating second harmonic spectral components of at least a part of the octave-spanning spectral components. In addition, the laser system includes an f-2f-interferometry device for generating a beating signal of at least a part of the overlapping spectral components exiting the frequency-doubling element and interfering with each other at the f-2f-interferomtry device and for determining and/or controlling the CEO of the emitted laser pulses based on the beating signal.Type: GrantFiled: December 4, 2023Date of Patent: March 24, 2026Assignees: Max-Planck-Gessellschaft zur Förderung der Wissenschaften e.V., Ludwig-Maximilians-Universität München, Center for Molecular Fingerprinting; Molekuláris-Ujjlenyomat Kutató Közhasznú Nonprofit Kft.Inventors: Ka Fai Mak, Ferenc Krausz, Philipp Steinleitner, Nathalie Lenke, Maciej Kowalczyk, Alexander Weigel
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Publication number: 20250093633Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: December 6, 2024Publication date: March 20, 2025Inventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Patent number: 12189105Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: GrantFiled: May 8, 2023Date of Patent: January 7, 2025Assignee: Oxford University Innovation LimitedInventors: Philipp Kukura, Alexander Weigel, Justin Benesch
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Publication number: 20240255421Abstract: A spectroscopic measuring apparatus (100) being configured for measuring a spectral response of a sample (1), in particular a biological sample, comprises a fs laser source device (10) being arranged for an irradiation of the sample (1) with a sequence of probe light pulses (2) having a primary spectrum, a detector device (20) being arranged for a temporally and/or spectrally resolved detection of response light pulses (2?) having an altered spectrum and/or temporal structure and resulting from an interaction of the probe light pulses (2) with the sample (1), and a pulse modification device (30) comprising at least one quantum cascade laser (31 . . . 3N), wherein the pulse modification device (30) is configured to modify at least one of the probe light pulses (2) and the response light pulses (2?) by amplifying one or more spectral components of the at least one of the probe light pulses (2) and the response light pulses (2?) with the at least one quantum cascade laser (31 . . . 3N).Type: ApplicationFiled: May 27, 2021Publication date: August 1, 2024Inventors: Alexander Weigel, Qu Shizhen, Ka Fai Mak, Ferenc Krausz
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Publication number: 20240106181Abstract: A laser system generates laser pulses having a determined carrier-envelope-offset, CEO. The laser system includes a Cr-doped II-VI based laser oscillator system having a resonator cavity, which emits laser pulses having a peak power of at least 0.75 MW. The laser system further includes a nonlinear optical element for spectrally broadening at least a part of the emitted laser pulses irradiated onto the nonlinear optical element to provide the laser pulses with octave-spanning spectral components, and a frequency-doubling element for generating second harmonic spectral components of at least a part of the octave-spanning spectral components. In addition, the laser system includes an f-2f-interferometry device for generating a beating signal of at least a part of the overlapping spectral components exiting the frequency-doubling element and interfering with each other at the f-2f-interferomtry device and for determining and/or controlling the CEO of the emitted laser pulses based on the beating signal.Type: ApplicationFiled: December 4, 2023Publication date: March 28, 2024Inventors: Ka Fai Mak, Ferenc Krausz, Philipp Steinleitner, Nathalie Lenke, Maciej Kowalczyk, Alexander Weigel
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Publication number: 20240039235Abstract: A laser pulse sequence measuring method for measuring a delay between a pair of pulses from two laser pulse sequences (1, 2), comprises the steps of creating a first laser pulse sequence (1) of first laser pulses (1A) and a second laser pulse sequence (2) of second laser pulses (2A), and generating a delay signal (3) which represents the delay between the pair of pulses from the first and second laser pulse sequences (1, 2), wherein the step of generating the delay signal (3) includes creating intra-pulse difference frequency generation (IPDFG) pulses (4) by applying intra-pulse difference frequency generation to the first laser pulses (1A) in a difference frequency generation (DFG) medium (21), providing phase-stable reference waveforms (5) based on the IPDFG pulses (4), and electro-optic sampling (EOS) of the electric field of the phase-stable reference waveforms (5) with sampling pulses (6) in an EOS medium (22), wherein the sampling pulses (6) are created based on the second laser pulses (2A), for generatType: ApplicationFiled: December 22, 2020Publication date: February 1, 2024Inventors: Alexander WEIGEL, Theresa BUBERL, Ferenc KRAUSZ, Ioachim PUPEZA
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Publication number: 20230359009Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: May 8, 2023Publication date: November 9, 2023Applicant: Oxford University Innovation LimitedInventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Publication number: 20200386975Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: August 13, 2020Publication date: December 10, 2020Inventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Patent number: 10775597Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: GrantFiled: August 21, 2018Date of Patent: September 15, 2020Assignee: Oxford University Innovation LimitedInventors: Philipp Kukura, Alexander Weigel, Justin Benesch
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Publication number: 20190004299Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: August 21, 2018Publication date: January 3, 2019Inventors: Philipp KUKURA, Alexander WEIGEL
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Publication number: 20120152608Abstract: A printed circuit board having a generally box-like carrier plate with a top side and an underside. The board has at least first and second conductor track plane separated by a first distance and an electrical circuit which occupies at least one section of the carrier plate. The section contains a screen for protecting the circuit from electromagnetic interference. The screen has a first screening conductor track which is arranged on the first conductor track plane and surrounds the section, and a second screening conductor track which is arranged on the second conductor track plane and also surrounds the section. The first and second screening conductor tracks are congruent at least in a circumferential region which surrounds the circuit. The screen has, in the circumferential region, a plurality of plated-through holes which penetrate the carrier plate and connect the first and second screening conductor tracks.Type: ApplicationFiled: December 16, 2011Publication date: June 21, 2012Applicant: Semikron Elektronik GmbH & Ko. KGInventors: Alexander Weigel, Mario Mitzel