Abstract: A method and apparatus are provided for using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: An apparatus including a multiplier circuit and a multiplexing circuit. The multiplier circuit may be configured to multiply a first multiplicand and a second multiplicand based on a programmable base value and generate a plurality of intermediate values, each intermediate value representing a result of the multiplication reduced by a respective irreducible polynomial. The multiplexing circuit may be configured to generate an output in response to the plurality of intermediate values received from the multiplier circuit and the programmable base value.

Abstract: A method and apparatus are provided for using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: A syndrome calculator receives an input codeword and calculates a first set of syndromes. A syndrome transform receives the first set of syndromes having and determines a second set of syndromes. The second set of syndromes is based on the first set of syndromes. The second set of syndromes has number of syndromes that is less than the number of syndromes in the first set of syndromes. A key equation solver receives the second set of syndromes and produces an indication of zero or more error locations and an indication of zero or more error values.

Abstract: A fixed length Reed-Solomon encoder is configured to produce a first fixed number of redundant symbols. The fixed length Reed-Solomon encoder is configured with an encoding polynomial that is fixed. A symbol preprocessor maps each input data symbol to a transformed input data symbol. A symbol postprocessor maps a second fixed number of redundant symbols output from the fixed length Reed-Solomon encoder to a set of redundant symbols. The second fixed number of redundant symbols is less than the first fixed number of redundant symbols.

Abstract: A memory collar including a first circuit and a second circuit. The first circuit may be configured to generate one or more data sequences in response to one or more test commands. The one or more data sequences may be presented to a memory during a test mode. The second circuit may be configured to pre-process one or more outputs generated by the memory in response to the one or more data sequences.

Abstract: An apparatus including a controller configured to present one or more commands and receive one or more responses, a plurality of transport circuits configured to receive one of the commands, present the responses, and generate one or more control signals, and a plurality of memory-controlling circuits, each coupled to a respective one of the plurality of transport circuits and configured to generate one or more memory access signals in response to the one or more control signals, receive one or more memory output signals from a respective memory in response to the one or more memory access signals, and generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.

Abstract: A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.

Abstract: A memory collar includes a first circuit, a second circuit and a third circuit. The first circuit may be configured to generate a first control signal, a second control signal and a third control signal in response to one or more test commands. The second circuit may be configured to generate a fourth control signal in response to said third control signal and the fourth control signal. The third circuit may be configured to generate one or more address sequences. The one or more address sequences are presented to a memory during a test mode.

Abstract: An apparatus including a multiplier circuit and a multiplexing circuit. The multiplier circuit may be configured to multiply a first multiplicand and a second multiplicand based on a programmable base value and generate a plurality of intermediate values, each intermediate value representing a result of the multiplication reduced by a respective irreducible polynomial. The multiplexing circuit may be configured to generate an output in response to the plurality of intermediate values received from the multiplier circuit and the programmable base value.

Abstract: A syndrome calculator receives an input codeword and calculates a first set of syndromes. A syndrome transform receives the first set of syndromes having and determines a second set of syndromes. The second set of syndromes is based on the first set of syndromes. The second set of syndromes has number of syndromes that is less than the number of syndromes in the first set of syndromes. A key equation solver receives the second set of syndromes and produces an indication of zero or more error locations and an indication of zero or more error values.

Abstract: A fixed length Reed-Solomon encoder is configured to produce a first fixed number of redundant symbols. The fixed length Reed-Solomon encoder is configured with an encoding polynomial that is fixed. A symbol preprocessor maps each input data symbol to a transformed input data symbol. A symbol postprocessor maps a second fixed number of redundant symbols output from the fixed length Reed-Solomon encoder to a set of redundant symbols. The second fixed number of redundant symbols is less than the first fixed number of redundant symbols.

Abstract: A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: An apparatus comprising a controller, a plurality of transport circuits and a plurality of memory-controlling circuits. The controller may be configured to (i) present one or more commands and (ii) receive one or more responses. Each of the plurality of transport circuits may be configured to (i) receive one of the commands, (ii) present the responses, and (iii) generate one or more control signals. Each of the plurality of memory-controlling circuits may be (i) coupled to a respective one of the plurality of transport circuits and (ii) configured to (i) generate one or more memory access signals in response to the one or more control signals, (ii) receive one or more memory output signals from a respective memory in response to the one or more memory access signals and (iii) generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized.

Abstract: A memory collar includes a first circuit, a second circuit and a third circuit. The first circuit may be configured to generate a first control signal, a second control signal and a third control signal in response to one or more test commands. The second circuit may be configured to generate a fourth control signal in response to said third control signal and the fourth control signal. The third circuit may be configured to generate one or more address sequences. The one or more address sequences are presented to a memory during a test mode.

Abstract: A memory collar including a first circuit and a second circuit. The first circuit may be configured to generate one or more data sequences in response to one or more test commands. The one or more data sequences may be presented to a memory during a test mode. The second circuit may be configured to pre-process one or more outputs generated by the memory in response to the one or more data sequences.

Abstract: An apparatus comprising a processor and an internal memory. The processor may be configured to test an external memory using (i) a netlist and (ii) a testing program. The internal memory may be configured to store the testing program. The testing program may be downloadable to the internal memory independently from the storing of the netlist.

Abstract: A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Abstract: A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.