Patents by Inventor Alexandre Chibane

Alexandre Chibane has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting defective electrodes in a micro-electrode matrix
    Patent number: 9310419
    Abstract: The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.
    Type: Grant
    Filed: March 20, 2013
    Date of Patent: April 12, 2016
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE
    Inventors: Alexandre Chibane, Pierre Grangeat
  • Method for Detecting Defective Electrodes in a Micro-Electrode Matrix
    Publication number: 20130297236
    Abstract: The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.
    Type: Application
    Filed: March 20, 2013
    Publication date: November 7, 2013
    Inventors: Alexandre CHIBANE, Pierre Grangeat
  • Method for detecting defective electrodes in a micro-electrode matrix
    Publication number: 20080314765
    Abstract: Method for detecting defective electrodes in a micro-electrode matrix The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.
    Type: Application
    Filed: June 13, 2008
    Publication date: December 25, 2008
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE
    Inventors: Alexandre Chibane, Pierre Grangeat