Patents by Inventor Alexandre De Poorter

Alexandre De Poorter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7392448
    Abstract: Methods and apparatus are provided for testing digital circuits. In one implementation, a scan chain test structure is provided that includes a cell chain, a first scan chain, and a second scan chain. The first scan chain is operable to test digital circuitry within a first portion of the cell chain, and the second scan chain is operable to test digital circuitry within a second portion of the cell chain. The first scan chain is further operable to test digital circuitry within the second scan chain, and the second scan chain is further operable to test digital circuitry within the first scan chain.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: June 24, 2008
    Assignee: Atmel Corporation
    Inventors: Alexandre De Poorter, Fabrice Picot
  • Publication number: 20070022340
    Abstract: Methods and apparatus are provided for testing digital circuits. In one implementation, a scan chain test structure is provided that includes a cell chain, a first scan chain, and a second scan chain. The first scan chain is operable to test digital circuitry within a first portion of the cell chain, and the second scan chain is operable to test digital circuitry within a second portion of the cell chain. The first scan chain is further operable to test digital circuitry within the second scan chain, and the second scan chain is further operable to test digital circuitry within the first scan chain.
    Type: Application
    Filed: August 17, 2005
    Publication date: January 25, 2007
    Inventors: Alexandre De Poorter, Fabrice Picot