Patents by Inventor Alexandre Nikitine
Alexandre Nikitine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7522289Abstract: The present invention provides an interferometric method and system to measure the height profile of reflecting objects with respect of a reference surface. The method comprises obtaining an image of the object along a specular reflection axis, wherein the image corresponds to an intensity pattern projected on the object along a projection axis, and wherein the specular reflection axis corresponds to a direction along which a portion of the intensity pattern is specularly reflected by the object. Then the method comprises calculating an object phase using the image and determining the height profile using the object phase and a reference phase associated to the reference surface.Type: GrantFiled: October 13, 2004Date of Patent: April 21, 2009Assignee: Solvision, Inc.Inventors: Michel Cantin, Benoît Quirion, Alexandre Nikitine
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Patent number: 7403650Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: GrantFiled: June 26, 2006Date of Patent: July 22, 2008Assignee: SolVision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Publication number: 20080068617Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the dimensions of a 3D object using only two images thereof. The method and the system perform the height mapping of the object or the height mapping of a portion of the object. The present invention can be used to assess the quality of the surface of an object that is under inspection. It can also be used to evaluate the volume of the object under inspection.Type: ApplicationFiled: March 28, 2007Publication date: March 20, 2008Applicant: SOLVISION INC.Inventors: Michel Cantin, Alexandre Nikitine, Benoit Quirion
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Patent number: 7340107Abstract: A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The relative light intensities are selected in order to assure the best 2D detection while maintaining the 3D measurements.Type: GrantFiled: September 4, 2003Date of Patent: March 4, 2008Assignee: Sol Vision Inc.Inventors: Louis Berard, Michel Cantin, Alexandre Nikitine
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Publication number: 20070146727Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: ApplicationFiled: June 26, 2006Publication date: June 28, 2007Applicant: SOLVISION INC.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Patent number: 7079666Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: GrantFiled: March 22, 2001Date of Patent: July 18, 2006Assignee: Solvision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Publication number: 20060077398Abstract: The present invention provides an interferometric method and system to measure the height profile of reflecting objects with respect of a reference surface. The method comprises obtaining an image of the object along a specular reflection axis, wherein the image corresponds to an intensity pattern projected on the object along a projection axis, and wherein the specular reflection axis corresponds to a direction along which a portion of the intensity pattern is specularly reflected by the object. Then the method comprises calculating an object phase using the image and determining the height profile using the object phase and a reference phase associated to the reference surface.Type: ApplicationFiled: October 13, 2004Publication date: April 13, 2006Inventors: Michel Cantin, Benoit Quirion, Alexandre Nikitine
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Patent number: 7023559Abstract: A method and a system for measuring the relief of an object are described herein. The system includes a grid projecting for projecting a grid, an image acquisition apparatus that includes a camera, and a computer. Providing a reference object having common elements with the object to measure, the method includes the steps of a) positioning the grid at three different known positions relative to the camera and the common elements; b) for each position of the grid, projecting the grid unto the reference object and, with the camera, taking an image of the reference object to yield three images having values for each pixel of the camera and c) computing the reference object phase for each pixel using the three reference object intensity values for the corresponding pixel. Steps a), b) and c) are repeated by replacing the reference object by the object to be measured.Type: GrantFiled: July 14, 2000Date of Patent: April 4, 2006Assignee: Solvision Inc.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Publication number: 20060017936Abstract: A method and system for determining a height of a substantially transparent object having a refractive index are presented. The method is based on Fast Moiré Interferometry and comprises obtaining at least one image of the object corresponding to an intensity pattern projected on the pellicle. Then the method comprises establishing a phase associated to the object using the image and comprises determining the height using the object phase, the refractive index and a reference phase corresponding to a reference surface.Type: ApplicationFiled: July 22, 2004Publication date: January 26, 2006Inventors: Michel Cantin, Alexandre Nikitine
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Publication number: 20040130730Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the dimensions of a 3D object using only two images thereof. The method and the system perform the height mapping of the object or the height mapping of a portion of the object. The present invention can be used to assess the quality of the surface of an object that is under inspection. It can also be used to evaluate the volume of the object under inspection.Type: ApplicationFiled: November 20, 2003Publication date: July 8, 2004Inventors: Michel Cantin, Alexandre Nikitine, Benoit Quirion
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Publication number: 20040047517Abstract: A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The relative light intensities are selected in order to assure the best 2D detection while maintaining the 3D measurements.Type: ApplicationFiled: September 4, 2003Publication date: March 11, 2004Applicant: SOLVISION INC.Inventors: Louis Berard, Michel Cantin, Alexandre Nikitine
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Publication number: 20020018118Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.Type: ApplicationFiled: March 22, 2001Publication date: February 14, 2002Applicant: SOLVISION INC.Inventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine
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Patent number: RE42899Abstract: A method and a system for measuring the relief of an object are described herein. The system includes a grid projecting for projecting a grid, an image acquisition apparatus that includes a camera, and a computer. Providing a reference object having common elements with the object to measure, the method includes the steps of a) positioning the grid at three different known positions relative to the camera and the common elements; b) for each position of the grid, projecting the grid unto the reference object and, with the camera, taking an image of the reference object to yield three images having values for each pixel of the camera and c) computing the reference object phase for each pixel using the three reference object intensity values for the corresponding pixel. Steps a), b) and c) are repeated by replacing the reference object by the object to be measured.Type: GrantFiled: July 14, 2000Date of Patent: November 8, 2011Assignee: Zygo CorporationInventors: Alain Coulombe, Michel Cantin, Alexandre Nikitine