Patents by Inventor Alexandre Paduch

Alexandre Paduch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240230904
    Abstract: The invention relates to a laser tracker for the industrial, coordinative position determination of a target, the laser tracker providing two measurement functionalities, namely a measurement functionality for measuring and tracking a cooperative, e.g. retroreflective, target and a measurement functionality for the e.g. scanning measurement of a target with diffuse scattering, wherein both measurement functionalities can be carried out and referenced to each other by means of the same optoelectronic distance measurement device.
    Type: Application
    Filed: February 24, 2021
    Publication date: July 11, 2024
    Applicant: LEICA GEOSYSTEMS AG
    Inventors: Marcel ROHNER, Alexandre PADUCH, Thomas LÜTHI
  • Publication number: 20240134048
    Abstract: The invention relates to a laser tracker for the industrial, coordinative position determination of a target, the laser tracker providing two measurement functionalities, namely a measurement functionality for measuring and tracking a cooperative, e.g. retroreflective, target and a measurement functionality for the e.g. scanning measurement of a target with diffuse scattering, wherein both measurement functionalities can be carried out and referenced to each other by means of the same optoelectronic distance measurement device.
    Type: Application
    Filed: February 24, 2021
    Publication date: April 25, 2024
    Applicant: LEICA GEOSYSTEMS AG
    Inventors: Marcel ROHNER, Alexandre PADUCH, Thomas LÜTHI
  • Patent number: 10845182
    Abstract: Some embodiments of the invention include a probe body of an optical probe assembly. The probe assembly may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprising a coupling unit at a first end of the probe body designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body.
    Type: Grant
    Filed: December 22, 2016
    Date of Patent: November 24, 2020
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Alexandre Paduch, Thomas Jensen
  • Publication number: 20170184395
    Abstract: Some embodiments of the invention include a probe body of an optical probe assembly. The probe assembly may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprising a coupling unit at a first end of the probe body designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body.
    Type: Application
    Filed: December 22, 2016
    Publication date: June 29, 2017
    Applicant: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Alexandre PADUCH, Thomas JENSEN
  • Patent number: 6879387
    Abstract: The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.
    Type: Grant
    Filed: April 4, 2003
    Date of Patent: April 12, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Alexandre Paduch
  • Publication number: 20040196449
    Abstract: The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.
    Type: Application
    Filed: April 4, 2003
    Publication date: October 7, 2004
    Applicant: Agilent Technologies, Inc.
    Inventor: Alexandre Paduch