Patents by Inventor Alexei Ermakov

Alexei Ermakov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230157297
    Abstract: The use of a composition as antiviral and/or antimicrobial agent, wherein the composition includes at least a positively charged natural or unnatural amino acid, an organic acid, a cationic polymer and a zwitterionic surfactant.
    Type: Application
    Filed: April 22, 2021
    Publication date: May 25, 2023
    Applicant: Cedar Advanced Technology Group Ltd.
    Inventors: Said FARHA, Kamal FARHA, Gerald A. HUTCHINSON, Bradley J. NELSON, Salvador PANÉ VIDAL, Alexei ERMAKOV, Carlos FRANCO PUJANTE, Nuria IZQUIERDO USEROS, Julian BLANCO ARBUES
  • Patent number: 11248904
    Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.
    Type: Grant
    Filed: March 26, 2018
    Date of Patent: February 15, 2022
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Alexei Ermakov, Xiuyan Li, Eric Garfunkel, Leonard C. Feldman, Torgny Gustafsson
  • Patent number: 11221210
    Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.
    Type: Grant
    Filed: March 26, 2018
    Date of Patent: January 11, 2022
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Alexei Ermakov, Xiuyan Li, Eric Garfunkel, Leonard C. Feldman, Torgny Gustafsson
  • Publication number: 20210164777
    Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.
    Type: Application
    Filed: March 26, 2018
    Publication date: June 3, 2021
    Inventors: Alexei Ermakov, Xiuyan Li, Eric Garfunkel, Leonard C. Feldman, Torgny Gustafsson
  • Patent number: 10037880
    Abstract: Methods of operation of electrostatic ion trap mass spectrometers in which ions are autoresonantly driven at selected higher integer (>2) multiples of ion oscillation frequencies are provided. Excitation at multiples higher than the fundamental or double the fundamental ion oscillation frequency significantly improves both signal intensity and mass resolution. Each method allows excitation exclusively at one selected frequency that is an integer multiple of an ion's natural oscillation frequency, and thereby virtually eliminates ion excitation at unwanted harmonic frequencies. The resultant mass spectra are therefore clean, and do not display spectral features associated with rf excitation at unintended multiple harmonic frequencies. This has been demonstrated explicitly for 4× and 6× modes, and it is fully implementable at any odd or even multiples of ion oscillation frequencies.
    Type: Grant
    Filed: March 13, 2015
    Date of Patent: July 31, 2018
    Assignee: Rutgers, The State University of New Jersey
    Inventors: Alexei Ermakov, Barbara J. Hinch
  • Publication number: 20170018418
    Abstract: Methods of operation of electrostatic ion trap mass spectrometers in which ions are autoresonantly driven at selected higher integer (>2) multiples of ion oscillation frequencies are provided. Excitation at multiples higher than the fundamental or double the fundamental ion oscillation frequency significantly improves both signal intensity and mass resolution. Each method allows excitation exclusively at one selected frequency that is an integer multiple of an ion's natural oscillation frequency, and thereby virtually eliminates ion excitation at unwanted harmonic frequencies. The resultant mass spectra are therefore clean, and do not display spectral features associated with rf excitation at unintended multiple harmonic frequencies. This has been demonstrated explicitly for 4× and 6× modes, and it is fully implementable at any odd or even multiples of ion oscillation frequencies.
    Type: Application
    Filed: March 13, 2015
    Publication date: January 19, 2017
    Inventors: Alexei Ermakov, Barbara J. Hinch
  • Publication number: 20080035845
    Abstract: The inventive apparatus measures workfunction values using deflection of an electron beam without direct contact of the electron beam with the sample surface. The apparatus, mounted within a vacuum chamber, includes an electron gun, a position sensitive electron detector, and a sample. The sample is located such that an electron beam emanating from the gun can approach the surface and then be deflected into the position sensitive electron detector. Workfunction values are then derived from a measured deflected-electron position distribution.
    Type: Application
    Filed: March 13, 2007
    Publication date: February 14, 2008
    Inventors: Alexei Ermakov, Barbara Hinch
  • Patent number: 6448795
    Abstract: The inventive apparatus is capable of accurate contactless sample conductance measurements. In accordance with the invention, a three coil apparatus for inductive conductance measurements comprises at least three coils, (or inductive devices,) a radio frequency (RF) generating device in conjunction with electronic circuitry for radio frequency amplitude measurement and comparison of radio frequency amplitude signals. The attainable accuracy is improved over that achieved using other conventional non-contact means by processing the differences of RF amplitude signals observed across pairs of sensing coils. Also, this invention does not require more complex RF signal processing, such as analysis of in-phase and quadrature voltage data. In a preferred embodiment, the natural resonance frequencies of the two sensing coils are tuned slightly off the RF driving frequency such that a monotonic response across a wide range of the sample's conductivity is achieved.
    Type: Grant
    Filed: February 12, 1999
    Date of Patent: September 10, 2002
    Inventors: Alexei Ermakov, Barbara Jane Hinch