Patents by Inventor Alexei Vershinin

Alexei Vershinin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
    Patent number: 8130908
    Abstract: An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.
    Type: Grant
    Filed: February 23, 2010
    Date of Patent: March 6, 2012
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Huapeng Huang, Alexei Vershinin
  • X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIENTATION USING X-RAY FOCUSING OPTIC
    Publication number: 20110038457
    Abstract: An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.
    Type: Application
    Filed: February 23, 2010
    Publication date: February 17, 2011
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Huapeng HUANG, Alexei VERSHININ