Patents by Inventor Alexey Dmitrievich LANTSOV
Alexey Dmitrievich LANTSOV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11353398Abstract: A system for extraction of optical properties of a turbid medium by using diffuse reflectometry may include at least one light source, an optical receiver, at least one separator, and at least one processor configured to control the optical receiver, while the radiation is provided to the turbid medium in the radiation input area of the at least one light source, to sequentially open each LC cell from the array of LC cells, and simultaneously receive radiation, passed through the sequentially opened LC cells and corresponding microlenses, by corresponding photodetectors from the array of photodetectors to obtain the distribution of radiation intensity; and extract the optical properties of the turbid medium based on the distribution of radiation intensity.Type: GrantFiled: December 16, 2020Date of Patent: June 7, 2022Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Grigorievich Anikanov, Tatiana Igorevna Kopysova, Pavel Aleksandrovich Ivshin, Alexey Dmitrievich Lantsov, Vasily Victorovich Grigorev, Maxim Vladimirovich Ryabko
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Publication number: 20210262932Abstract: A system for extraction of optical properties of a turbid medium by using diffuse reflectometry may include at least one light source, an optical receiver, at least one separator, and at least one processor configured to control the optical receiver, while the radiation is provided to the turbid medium in the radiation input area of the at least one light source, to sequentially open each LC cell from the array of LC cells, and simultaneously receive radiation, passed through the sequentially opened LC cells and corresponding microlenses, by corresponding photodetectors from the array of photodetectors to obtain the distribution of radiation intensity; and extract the optical properties of the turbid medium based on the distribution of radiation intensity.Type: ApplicationFiled: December 16, 2020Publication date: August 26, 2021Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Grigorievich Anikanov, Tatiana Igorevna Kopysova, Pavel Aleksandrovich Ivshin, Alexey Dmitrievich Lantsov, Vasily Victorovich Grigorev, Maxim Vladimirovich Ryabko
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Patent number: 11045103Abstract: Physiological parameter detecting apparatuses and methods of detecting the physiological parameters are provided. A physiological parameter detecting apparatus includes: a light source configured to emit a light onto a region of an object; an optical path converter configured to receive the light returning from the object and convert an optical path of the received light; an optical detector configured to detect the light that has the converted optical path; and a controller configured to extract physiological information of the object from the detected light.Type: GrantFiled: April 28, 2017Date of Patent: June 29, 2021Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Andreevich Shchekin, Maxim Vladimirovich Riabko, Anton Sergeevich Medvedev, Alexey Dmitrievich Lantsov, Sergey Nikolaevich Koptyaev
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Publication number: 20210121068Abstract: A spectrometer may include: a tunable on-chip laser source configured to irradiate a biological tissue with laser radiation; a photodetector configured to receive the laser radiation reflected from the biological tissue; and at least one processor. The tunable on-chip laser source may include: a semiconductor gain chip having a gain bandwidth for operating the tunable on-chip laser source in a predetermined wavelength range; and a plurality of resonator cavities connected between the semiconductor gain chip and the at least one processor, and configured to perform a coarse high-speed measurement and a fine measurement to measure a spectrum of the laser radiation reflected from the biological tissue.Type: ApplicationFiled: September 15, 2020Publication date: April 29, 2021Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Dmitrievich LANTSOV, Alexey Andreevich SHCHEKIN, Sergey Nikolaevich KOPTYAEV, Alexey Grigorievich ANIKANOV, Maksim Vladimirovich RYABKO, Pavel Alexandrovich IVSHIN, Vasiliy Viktorovich GRIGORIEV, Tatyana Igorevna KOPYSOVA
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Patent number: 10405806Abstract: An apparatus for and a method of measuring blood pressure are provided. The apparatus includes a sensor configured to radiate light to a body part, and detect a light signal that is changed due to the body part. The apparatus further includes a signal processor configured to determine a bio signal based on the light signal; and a central processing unit configured to determine a blood pressure based on the bio signal and a blood pressure estimation algorithm.Type: GrantFiled: December 7, 2015Date of Patent: September 10, 2019Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Chanwook Baik, Jisoo Kyoung, Maxim Vladimirovich Riabko, Youngzoon Yoon, Alexey Dmitrievich Lantsov, Younggeun Roh, Jaesoong Lee
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Patent number: 10296776Abstract: A biometrics authentication apparatus and a biometrics authentication method are disclosed. The biometrics authentication apparatus includes: a light source configured to emit a light; a modulator configured to change a spatial distribution of the light that is scattered and reflected from a region of interest of a user; a detector configured to detect an integral power of the light that is scattered from the region of interest; and a processor configured to obtain a measurement signal based on the integral power of the light, compare the measurement signal with a reference signal stored in a memory, and determine whether to authenticate the user based on a degree of match between the measurement signal and the reference signal.Type: GrantFiled: February 28, 2017Date of Patent: May 21, 2019Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Dmitrievich Lantsov, Alexey Andreevich Shchekin, Maksim Vladimirovich Riabko, Anton Sergeevich Medvedev, Sergey Nikolaevich Koptyaev
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Patent number: 10224688Abstract: Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.Type: GrantFiled: January 12, 2018Date of Patent: March 5, 2019Assignees: SAMSUNG ELECTRONICS CO., LTD., INTERNATIONAL CENTER FOR QUANTUM OPTICS & QUANTUM TECHNOLOGIES LIMITED LIABILITY COMPANYInventors: Sergey Nikolaevich Koptyaev, Grigoriy Vasil'evich Lihachev, Nikolay Genad'evich Pavlov, Alexey Andreevich Shchekin, Igor Antonovich Bilenko, Maxim Vladimirovich Riabko, Mikhael Leonidovich Gorodetsky, Stanislav Vladimirovich Polonsky, Andrey Sergeevich Voloshin, Alexey Dmitrievich Lantsov, Anton Sergeevich Medvedev, Valery Evgenievich Lobanov
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Patent number: 10206576Abstract: The laser speckle interferometric system includes a memory for storing a measurement result of a correction parameter and models for matching a result of processing the speckle pattern to the parameters of the object and a processor for stabilizing the speckle pattern detected by controlling a condition for detecting the speckle pattern in real time, processing a time-varying function representing a temporal change in the speckle pattern based on the speckle pattern and the parameters and generating data indicating tested parameters.Type: GrantFiled: September 10, 2015Date of Patent: February 19, 2019Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexander Viacheslavovich Shcherbakov, Alexey Dmitrievich Lantsov
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Publication number: 20180351319Abstract: Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.Type: ApplicationFiled: January 12, 2018Publication date: December 6, 2018Applicants: SAMSUNG ELECTRONICS CO., LTD., INTERNATIONAL CENTER FOR QUANTUM OPTICS & QUANTUM TECHNOLOGIES LIMITED LIABILITY COMPANYInventors: Sergey Nikolaevich KOPTYAEV, Grigoriy Vasil'evich LIHACHEV, Nikolay Genad'evich PAVLOV, Alexey Andreevich SHCHEKIN, Igor Antonovich BILENKO, Maxim Vladimirovich RIABKO, Mikhael Leonidovich GORODETSKY, Stanislav Vladimirovich POLONSKY, Andrey Sergeevich VOLOSHIN, Alexey Dmitrievich LANTSOV, Anton Sergeevich MEDVEDEV, Valery Evgenievich LOBANOV
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Publication number: 20170311820Abstract: Physiological parameter detecting apparatuses and methods of detecting the physiological parameters are provided. A physiological parameter detecting apparatus includes: a light source configured to emit a light onto a region of an object; an optical path converter configured to receive the light returning from the object and convert an optical path of the received light; an optical detector configured to detect the light that has the converted optical path; and a controller configured to extract physiological information of the object from the detected light.Type: ApplicationFiled: April 28, 2017Publication date: November 2, 2017Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Andreevich SHCHEKIN, Maxim Vladimirovich RIABKO, Anton Sergeevich MEDVEDEV, Alexey Dmitrievich LANTSOV, Sergey Nikolaevich KOPTYAEV
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Publication number: 20170286741Abstract: A biometrics authentication apparatus and a biometrics authentication method are disclosed. The biometrics authentication apparatus includes: a light source configured to emit a light; a modulator configured to change a spatial distribution of the light that is scattered and reflected from a region of interest of a user; a detector configured to detect an integral power of the light that is scattered from the region of interest; and a processor configured to obtain a measurement signal based on the integral power of the light, compare the measurement signal with a reference signal stored in a memory, and determine whether to authenticate the user based on a degree of match between the measurement signal and the reference signal.Type: ApplicationFiled: February 28, 2017Publication date: October 5, 2017Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexey Dmitrievich LANTSOV, Alexey Andreevich SHCHEKIN, Maksim Vladimirovich RIABKO, Anton Sergeevich MEDVEDEV, Sergey Nikolaevich KOPTYAEV
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Publication number: 20160256116Abstract: An apparatus for and a method of measuring blood pressure are provided. The apparatus includes a sensor configured to radiate light to a body part, and detect a light signal that is changed due to the body part. The apparatus further includes a signal processor configured to determine a bio signal based on the light signal; and a central processing unit configured to determine a blood pressure based on the bio signal and a blood pressure estimation algorithm.Type: ApplicationFiled: December 7, 2015Publication date: September 8, 2016Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Chanwook BAIK, Jisoo KYOUNG, Maxim Vladimirovich RIABKO, Youngzoon YOON, Alexey Dmitrievich LANTSOV, Younggeun ROH, Jaesoong LEE
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Patent number: 9400254Abstract: Provided are a method and device for measuring a critical dimension of a nanostructure.Type: GrantFiled: March 26, 2015Date of Patent: July 26, 2016Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexander Viacheslavovich Shcherbakov, Maxim Vladimirovich Riabko, Alexey Dmitrievich Lantsov
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Patent number: 9322640Abstract: Optical measuring systems for measuring geometrical parameters of nano-objects and methods of measuring a critical size (CS) are provided. The optical method of measuring the CS includes selecting parameters of an optic scheme and an illumination condition; recording a set of nanostructure images corresponding to various wavelengths with various defocusing levels of scattered radiation; calculating a plurality of sets of images of a nanostructure with various defocusing levels, corresponding to various wavelengths of the scattered radiation with CS values within a known range; and comparing a set of measured images of the nanostructure with the sets of the calculated images and determining a best approximate value of the CS values.Type: GrantFiled: August 7, 2013Date of Patent: April 26, 2016Assignee: SAMSING ELECTRONICS CO., LTD.Inventors: Sergey Nikolaevich Koptyaev, Maxim Vladimirovich Ryabko, Alexander Vyacheslavovich Shcherbakov, Alexey Dmitrievich Lantsov
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Publication number: 20160066790Abstract: The laser speckle interferometric system includes a memory for storing a measurement result of a correction parameter and models for matching a result of processing the speckle pattern to the parameters of the object and a processor for stabilizing the speckle pattern detected by controlling a condition for detecting the speckle pattern in real time, processing a time-varying function representing a temporal change in the speckle pattern based on the speckle pattern and the parameters and generating data indicating tested parameters.Type: ApplicationFiled: September 10, 2015Publication date: March 10, 2016Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexander Viacheslavovich SHCHERBAKOV, Alexey Dmitrievich LANTSOV
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Publication number: 20150276378Abstract: Provided are a method and device for measuring a critical dimension of a nanostructure.Type: ApplicationFiled: March 26, 2015Publication date: October 1, 2015Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Alexander Viacheslavovich SHCHERBAKOV, Maxim Vladimirovich RIABKO, Alexey Dmitrievich LANTSOV
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Publication number: 20140043471Abstract: Optical measuring systems for measuring geometrical parameters of nano-objects and methods of measuring a critical size (CS) are provided. The optical method of measuring the CS includes selecting parameters of an optic scheme and an illumination condition; recording a set of nanostructure images corresponding to various wavelengths with various defocusing levels of scattered radiation; calculating a plurality of sets of images of a nanostructure with various defocusing levels, corresponding to various wavelengths of the scattered radiation with CS values within a known range; and comparing a set of measured images of the nanostructure with the sets of the calculated images and determining a best approximate value of the CS values.Type: ApplicationFiled: August 7, 2013Publication date: February 13, 2014Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sergey Nikolaevich KOPTYAEV, Maxim Vladimirovich RYABKO, Alexander Vyacheslavovich HCHERBAKOV, Alexey Dmitrievich LANTSOV