Patents by Inventor Alexey Olegovich POLYAKOV
Alexey Olegovich POLYAKOV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230350301Abstract: Methods and apparatus for forming a patterned layer of material are disclosed. In one arrangement, a deposition-process material is provided in gaseous form. A layer of the deposition-process material is formed on the substrate by causing condensation or deposition of the gaseous deposition-process material. A selected portion of the layer of deposition-process material is irradiated to modify the deposition-process material in the selected portion.Type: ApplicationFiled: February 17, 2021Publication date: November 2, 2023Applicant: ASML NETHERLANDS B.V.Inventors: Evgenia KURGANOVA, Gosse Charles DE VRIES, Alexey Olegovich POLYAKOV, Jim Vincent OVERKAMP, Teis Johan COENEN, Tamara DRUZHININA, Sonia CASTELLANOS ORTEGA, Olivier Christian Maurice LUGIER
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Patent number: 11415886Abstract: A resist composition is disclosed which comprises a perovskite material with a structure having a chemical formula selected from ABX3, A2BX4, or ABX4, wherein A is a compound containing an NH3 group, B is a metal and X is a halide constituent. The perovskite material may comprise one or more of the following components: halogen-mixed perovskite material; metal-mixed perovskite material, and organic ligand mixed perovskite material.Type: GrantFiled: July 16, 2019Date of Patent: August 16, 2022Assignee: ASML Netherlands B.V.Inventors: Sander Frederik Wuister, Oktay Yildirim, Gijsbert Rispens, Alexey Olegovich Polyakov
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Publication number: 20220213593Abstract: Methods and apparatus for forming a patterned layer of material are disclosed. In one arrangement, a selected portion of a surface of a substrate is irradiated during a deposition process, the irradiation being such as to locally drive the deposition process in the selected portion to form a layer of deposited material in a pattern defined by the selected portion. The deposited material is annealed to modify the deposited material.Type: ApplicationFiled: March 20, 2020Publication date: July 7, 2022Applicant: ASML NETHERLANDS B.V.Inventors: Tamara DRUZHININA, Jim Vincent OVERKAMP, Alexey Olegovich POLYAKOV, Teis Johan COENEN, Evgenia KURGANOVA, Ionel Mugurel CIOBICA, Alexander Ludwig KLEIN, Albertus Victor Gerardus MANGNUS, Marijke SCOTUZZI, Bastiaan Maurice VAN DEN BROEK
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Patent number: 11232960Abstract: A pick-and-place tool including a plurality of movable holder structures, and a plurality of pick-and-place structures, each holder structure accommodating two or more of the pick-and-place structures, wherein at least one of the two or more pick-and-place structures of a respective holder structure is able to move along a respective holder structure independently from another at least one of the two or more pick-and-place structures of the respective holder structure, and wherein each pick-and-place structure includes a pick-up element configured to pick up a donor component at a donor structure and place the donor component an acceptor structure.Type: GrantFiled: April 20, 2017Date of Patent: January 25, 2022Assignee: ASML Netherlands B.V.Inventors: Yang-Shan Huang, Alexey Olegovich Polyakov, Coen Adrianus Verschuren, Pieter Willem Herman De Jager
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Publication number: 20210382209Abstract: A first diffusor configured to receive and transmit radiation has a plurality of layers, each layer arranged to change an angular distribution of EUV radiation passing through it differently. A second diffusor configured to receive and transmit radiation has a first layer and a second layer. The first layer is formed from a first material, the first layer including a nanostructure on at least one surface of the first layer. The second layer is formed from a second material adjacent to the at least one surface of the first layer such that the second layer also includes a nanostructure. The second material has a refractive index that is different to a refractive index of the first layer. The diffusors may be configured to receive and transmit EUV radiation.Type: ApplicationFiled: September 13, 2019Publication date: December 9, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Andrey NIKIPELOV, Marcus Adrianus VAN DE KERKHOF, Pieter-Jan VAN ZWOL, Laurentius Cornelius DE WINTER, Wouter Joep ENGELEN, Alexey Olegovich POLYAKOV
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PARTICLE BEAM APPARATUS, DEFECT REPAIR METHOD, LITHOGRAPHIC EXPOSURE PROCESS AND LITHOGRAPHIC SYSTEM
Publication number: 20210327678Abstract: A particle beam apparatus includes an object table configured to hold a semiconductor substrate; a particle beam source configured to generate a particle beam; a detector configured to detect a response of the substrate caused by interaction of the particle beam with the substrate and to output a detector signal representative of the response; and a processing unit configured to: receive or determine a location of one or more defect target areas on the substrate; control the particle beam source to inspect the one or more defect target areas; identify one or more defects within the one or more defect target areas, based on the detector signal obtained during the inspection of the one or more defect target areas; control the particle beam source to repair the one or more defects.Type: ApplicationFiled: August 22, 2019Publication date: October 21, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Ruben Cornelis MAAS, Alexey Olegovich POLYAKOV, Teis Johan COENEN -
Publication number: 20210079519Abstract: Methods and apparatuses for forming a patterned layer of material are disclosed. In one arrangement, a selected portion of a surface of a substrate is irradiated with electromagnetic radiation having a wavelength of less than 100 nm during a deposition process. Furthermore, an electric field controller is configured to apply an electric field that is oriented so as to force secondary electrons away from the substrate. The irradiation locally drives the deposition process in the selected portion and thereby causes the deposition process to, for example, form a layer of material in a pattern defined by the selected portion.Type: ApplicationFiled: February 21, 2019Publication date: March 18, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Pieter Willem Herman DE JAGER, Sander Frederik WUISTER, Marie-Claire VAN LARE, Ruben Cornelis MAAS, Alexey Olegovich POLYAKOV, Tamara DRUZHININA, Victoria VORONINA, Evgenia KURGANOVA, Jim Vincent OVERKAMP, Bernardo KASTRUP, Maarten VAN KAMPEN, Alexandr DOLGOV
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Patent number: 10948837Abstract: An apparatus for determining information relating to at least one target alignment mark in a semiconductor device substrate. The target alignment mark is initially at least partially obscured by an opaque carbon or metal layer on the substrate. The apparatus includes an energy delivery system configured to emit a laser beam for modifying at least one portion of the opaque layer to cause a phase change and/or chemical change in the at least one portion that increases the transparency of the portion. An optical signal can propagate through the modified portion to determine information relating to the target alignment mark.Type: GrantFiled: June 18, 2018Date of Patent: March 16, 2021Assignee: ASML Netherlands B.V.Inventors: An Gao, Sanjaysingh Lalbahadoersing, Andrey Alexandrovich Nikipelov, Alexey Olegovich Polyakov, Brennan Peterson
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Publication number: 20210055660Abstract: An inspection system that include a selective deposition tool configured to receive a sample and selectively deposit a material onto the sample, an inspection tool configured to perform an inspection process on the sample provided with the deposited material, and an enclosure configured to enclose the selective deposition tool and the inspection tool.Type: ApplicationFiled: February 25, 2019Publication date: February 25, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Alexey Olegovich POLYAKOV, Erwin Paul SMAKMAN, Andrey NIKIPELOV, Albertus Victor Gerardus MANGNUS
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Publication number: 20200159134Abstract: An apparatus for determining information relating to at least one target alignment mark in a semiconductor device substrate. The target alignment mark is initially at least partially obscured by an opaque carbon or metal layer on the substrate. The apparatus includes an energy delivery system configured to emit a laser beam for modifying at least one portion of the opaque layer to cause a phase change and/or chemical change in the at least one portion that increases the transparency of the portion. An optical signal can propagate through the modified portion to determine information relating to the target alignment mark.Type: ApplicationFiled: June 18, 2018Publication date: May 21, 2020Applicant: ASML NETHERLANDS B.V.Inventors: An GAO, Sanjaysingh LALBAHADOERSING, Audrey Alexandrovich NIKIPELOV, Alexey Olegovich POLYAKOV, Brennan PETERSON
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Patent number: 10555407Abstract: A target structure (T) made by lithography or used in lithography is inspected by irradiating the structure at least a first time with EUV radiation (304) generated by inverse Compton scattering. Radiation (308) scattered by the target structure in reflection or transmission is detected (312) and properties of the target structure are calculated by a processor (340) based on the detected scattered radiation. The radiation may have a first wavelength in the EUV range of 0.1 nm to 125 nm. Using the same source and controlling an electron energy, the structure may be irradiated multiple times with different wavelengths within the EUV range, and/or with shorter (x-ray) wavelengths and/or with longer (UV, visible) wavelengths. By rapid switching of electron energy in the inverse Compton scattering source, irradiation at different wavelengths can be performed several times per second.Type: GrantFiled: April 18, 2019Date of Patent: February 4, 2020Assignee: ASML Netherlands B.V.Inventors: Alexey Olegovich Polyakov, Richard Quintanilha, Vadim Yevgenyevich Banine, Coen Adrianus Verschuren
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Publication number: 20190339615Abstract: A resist composition is disclosed which comprises a perovskite material with a structure having a chemical formula selected from ABX3, A2BX4, or ABX4, wherein A is a compound containing an NH3 group, B is a metal and X is a halide constituent. The perovskite material may comprise one or more of the following components: halogen-mixed perovskite material; metal-mixed perovskite material, and organic ligand mixed perovsikte material.Type: ApplicationFiled: July 16, 2019Publication date: November 7, 2019Applicant: ASML Netherlands B.V.Inventors: Sander Frederik WUISTER, Oktay YiLDiRiM, Gijsbert RISPENS, Alexey Olegovich POLYAKOV
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Patent number: 10416555Abstract: A resist composition is disclosed which comprises a perovskite material with a structure having a chemical formula selected from ABX3, A2BX4, or ABX4, wherein A is a compound containing an NH3 group, B is a metal and X is a halide constituent. The perovskite material may comprise one or more of the following components: halogen-mixed perovskite material; metal-mixed perovskite material, and organic ligand mixed perovsikte material.Type: GrantFiled: December 1, 2015Date of Patent: September 17, 2019Assignee: ASML Netherlands B.V.Inventors: Sander Frederik Wuister, Oktay Yildirim, Gijsbert Rispens, Alexey Olegovich Polyakov
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Publication number: 20190246480Abstract: A target structure (T) made by lithography or used in lithography is inspected by irradiating the structure at least a first time with EUV radiation (304) generated by inverse Compton scattering. Radiation (308) scattered by the target structure in reflection or transmission is detected (312) and properties of the target structure are calculated by a processor (340) based on the detected scattered radiation. The radiation may have a first wavelength in the EUV range of 0.1 nm to 125 nm. Using the same source and controlling an electron energy, the structure may be irradiated multiple times with different wavelengths within the EUV range, and/or with shorter (x-ray) wavelengths and/or with longer (UV, visible) wavelengths. By rapid switching of electron energy in the inverse Compton scattering source, irradiation at different wavelengths can be performed several times per second.Type: ApplicationFiled: April 18, 2019Publication date: August 8, 2019Applicant: ASML Netherlands B.V.Inventors: Alexey Olegovich POLYAKOV, Richard QUINTANILHA, Vadim Yevgenyevich BANINE, Coen Adrianus VERSCHUREN
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Patent number: 10342108Abstract: A target structure (T) made by lithography or used in lithography is inspected by irradiating the structure at least a first time with EUV radiation (304) generated by inverse Compton scattering. Radiation (308) scattered by the target structure in reflection or transmission is detected (312) and properties of the target structure are calculated by a processor (340) based on the detected scattered radiation. The radiation may have a first wavelength in the EUV range of 0.1 nm to 125 nm. Using the same source and controlling an electron energy, the structure may be irradiated multiple times with different wavelengths within the EUV range, and/or with shorter (x-ray) wavelengths and/or with longer (UV, visible) wavelengths. By rapid switching of electron energy in the inverse Compton scattering source, irradiation at different wavelengths can be performed several times per second.Type: GrantFiled: August 3, 2016Date of Patent: July 2, 2019Assignee: ASML Netherlands B.V.Inventors: Alexey Olegovich Polyakov, Richard Quintanilha, Vadim Yevgenyevich Banine, Coen Adrianus Verschuren
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Publication number: 20190148189Abstract: A pick-and-place tool including a plurality of movable holder structures, and a plurality of pick-and-place structures, each holder structure accommodating two or more of the pick-and-place structures, wherein at least one of the two or more pick-and-place structures of a respective holder structure is able to move along a respective holder structure independently from another at least one of the two or more pick-and-place structures of the respective holder structure, and wherein each pick-and-place structure includes a pick-up element configured to pick up a donor component at a donor structure and place the donor component an acceptor structure.Type: ApplicationFiled: April 20, 2017Publication date: May 16, 2019Applicant: ASML NETHERLANDS B.V.Inventors: Yang-Shan HUANG, Alexey Olegovich POLYAKOV, Coen Adrianus VERSCHUREN, Pieter Willem Herman DE JAGER
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Publication number: 20180220518Abstract: A target structure (T) made by lithography or used in lithography is inspected by irradiating the structure at least a first time with EUV radiation (304) generated by inverse Compton scattering. Radiation (308) scattered by the target structure in reflection or transmission is detected (312) and properties of the target structure are calculated by a processor (340) based on the detected scattered radiation. The radiation may have a first wavelength in the EUV range of 0.1 nm to 125 nm. Using the same source and controlling an electron energy, the structure may be irradiated multiple times with different wavelengths within the EUV range, and/or with shorter (x-ray) wavelengths and/or with longer (UV, visible) wavelengths. By rapid switching of electron energy in the inverse Compton scattering source, irradiation at different wavelengths can be performed several times per second.Type: ApplicationFiled: August 3, 2016Publication date: August 2, 2018Applicant: ASML Netherlands B.V.Inventors: Alexey Olegovich POLYAKOV, Richard QUINTANILHA, Vadim Yevgenyevich BANINE, Coen Adrianus VERSCHUREN
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Publication number: 20180004085Abstract: A resist composition is disclosed which comprises a perovskite material with a structure having a chemical formula selected from ABX3, A2BX4, or ABX4, wherein A is a compound containing an NH3 group, B is a metal and X is a halide constituent. The perovskite material may comprise one or more of the following components: halogen-mixed perovskite material; metal-mixed perovskite material, and organic ligand mixed perovsikte material.Type: ApplicationFiled: December 1, 2015Publication date: January 4, 2018Applicant: ASML Netherlands B.V.Inventors: Sander Frederik WUISTER, Oktay YILDIRIM, Gijsbert RISPENS, Alexey Olegovich POLYAKOV