Abstract: A semiconductor structure comprising III-N materials, includes: a support substrate; a main layer of III-N material, the main layer comprising a first section disposed on the support substrate and a second section disposed on the first section; an inter-layer of III-N material, disposed between the first section and the second section in order to compress the second section of the main layer, wherein the structure's inter-layer consists of a lower layer disposed on the first section and an upper layer disposed on the lower layer and formed by a superlattice.

Abstract: A semiconductor structure comprising III-N materials, includes: a support substrate; a main layer of III-N material, the main layer comprising a first section disposed on the support substrate and a second section disposed on the first section; an inter-layer of III-N material, disposed between the first section and the second section in order to compress the second section of the main layer, wherein the structure's inter-layer consists of a lower layer disposed on the first section and an upper layer disposed on the lower layer and formed by a superlattice.

Abstract: A semiconductor structure including a substrate, a buffer layer, a superlattice formed on the buffer layer, the superlattice including a pattern including n layers made of different materials, n being at least equal to 2, each layer including an AlxGayInwBzN type material where x+y+w+z=1, the thickness of each layer being less than the critical thickness thereof, the number of patterns being at least equal to 50, an insert layer wherein the material has a first lattice parameter, a layer of GaN material, wherein the lattice parameter is greater than the first lattice parameter such that the layer of GaN material is compressed by the insert layer.

Abstract: A semiconductor structure including a substrate, a buffer layer, a superlattice formed on the buffer layer , the superlattice including a pattern including n layers made of different materials, n being at least equal to 2, each layer including an AlxGayInwBzN type material where x+y+w+z=1, the thickness of each layer being less than the critical thickness thereof, the number of patterns being at least equal to 50, an insert layer wherein the material has a first lattice parameter, a layer of GaN material, wherein the lattice parameter is greater than the first lattice parameter such that the layer of GaN material is compressed by the insert layer.

Abstract: The invention relates to a method for manufacturing, by means of epitaxy, a monocrystalline layer of GaN on a substrate, wherein the coefficient of thermal expansion is less than the coefficient of thermal expansion of GaN, comprising the following steps: (b) three-dimensional epitaxial growth of a layer of GaN relaxed at the epitaxial temperature, (c1) growth of an intermediate layer of BwAlxGayInzN, (c2) growth of a layer of BwAlxGayInzN, (c3) growth of an intermediate layer of BwAlxGayInzN, at least one of the layers formed in steps (c1) to (c3) being an at least ternary III-N alloy comprising aluminium and gallium, (d) growth of said layer of GaN.

Abstract: The invention relates to a method for manufacturing, by means of epitaxy, a monocrystalline layer of GaN on a substrate, wherein the coefficient of thermal expansion is less than the coefficient of thermal expansion of GaN, comprising the following steps: (b) three-dimensional epitaxial growth of a layer of GaN relaxed at the epitaxial temperature, (c1) growth of an intermediate layer of BwAlxGayInzN, growth of a layer of BwAlxGayInzN, (c3) growth of an intermediate layer of BwAlxGayInzN, at least one of the layers formed in steps (c1) to (c3) being an at least ternary III-N alloy comprising aluminium and gallium, (d) growth of said layer of GaN.

Abstract: Under consideration here is a method for the production of periodic nanostructuring on one of the surfaces of a substrate (10), presenting a periodic network of dislocations, embedded within a crystalline area (4) located in the neighborhood of an interface (5) between the crystalline material surfaces of two components (1, 2) assembled by bonding to form the substrate (10). It comprises the following steps: formation, in the dislocations (3), of implants (6) made of a material other than that of the crystalline area (4); irradiation of the substrate (10) with electromagnetic waves (11) in order to cause absorption of electromagnetic energy localized in the implants (6), this absorption leading to the appearance of the periodic nanostructuring (12) on the surface of the substrate (10).

Abstract: Under consideration here is a method for the production of periodic nanostructuring on one of the surfaces of a substrate (10), presenting a periodic network of dislocations, embedded within a crystalline area (4) located in the neighbourhood of an interface (5) between the crystalline material surfaces of two components (1, 2) assembled by bonding to form the substrate (10). It comprises the following steps: formation, in the dislocations (3), of implants (6) made of a material other than that of the crystalline area (4); irradiation of the sbstrate (10) with electromagnetic waves (11) in order to cause absorption of electromagnetic energy localised in the implants (6), this absorption leading to the appearance of the periodic nanostructuring (12) on the surface of the substrate (10).