Patents by Inventor Alexis BONNIN

Alexis BONNIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement by atomic interferometry with multiple species of atoms
    Patent number: 10178752
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry, using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. One of these measurement results removes an indeterminacy among several possible values of the external parameter, by taking into account only the other measurement result. A method of this kind can be used to measure a coordinate of a gravitational field or a coordinate of an acceleration of the atoms.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: January 8, 2019
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
    Inventors: Nassim Zahzam, Yannick Bidel, Alexandre Bresson, Alexis Bonnin
  • Measurement by means of atomic interferometry with multiple species of atoms
    Patent number: 10090073
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: October 2, 2018
    Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
    Inventors: Nassim Zahzam, Yannick Bidel, Alexandre Bresson, Alexis Bonnin
  • MEASUREMENT BY MEANS OF ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES OF ATOMS
    Publication number: 20180040388
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
    Type: Application
    Filed: February 10, 2016
    Publication date: February 8, 2018
    Inventors: Nassim ZAHZAM, Yannick BIDEL, Alexandre BRESSON, Alexis BONNIN
  • MEASUREMENT BY ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES OF ATOMS
    Publication number: 20180020534
    Abstract: Disclosed is a method for measuring an external parameter by atomic interferometry, using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. One of these measurement results removes an indeterminacy among several possible values of the external parameter, by taking into account only the other measurement result. A method of this kind can be used to measure a coordinate of a gravitational field or a coordinate of an acceleration of the atoms.
    Type: Application
    Filed: February 10, 2016
    Publication date: January 18, 2018
    Inventors: Nassim ZAHZAM, Yannick BIDEL, Alexandre BRESSON, Alexis BONNIN