Abstract: The invention concerns a device and method for two-dimensional imaging and timing of particles or electromagnetic radiation with improved pulse-pair resolution. A detector, e.g. a michrochannel plate detector with a delay-line anode with three or more conductive members is used as exemplary embodiment for achieving these requirements. Redundant position and timing information is used for uniquely determine the timing and position of two or more particles, even if they arrive at the same time at the detector.

Abstract: The atom probe, which is suitable for use as a scanning atom probe, has a two-part counter electrode (10) and a detector (20) positioned behind the counter electrode. Power supply means are also provided for applying a positive dc voltage to a specimen under study and for applying a negative voltage pulse to a first plate (11) of the counter electrode while a second plate (12) and the detector (20) are held to ground. The two plates (11, 12) of the counter electrode are electrically isolated from one another with the plate (11) nearest the specimen shaped so that the electric field generated between the specimen and the plate (11) is concentrated at an individual microtip (31a) on the surface of the specimen. In use, the voltage pulse Vp applied to the first plate is shaped such that there is a substantially constant maximum negative voltage for a period of time dependent upon the separation of the specimen from the first plate.

Abstract: The invention concerns a device and method for two-dimensional imaging and timing of particles or electromagnetic radiation with improved pulse-pair resolution. A detector, e.g. a michrochannel plate detector with a delay-line anode with three or more conductive members is used as exemplary embodiment for achieving these requirements. Redundant position and timing information is used for uniquely determine the timing and position of two or more particles, even if they arrive at the same time at the detector.