Patents by Inventor Alfred Hirschle

Alfred Hirschle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning laser microscope system and methods of use
    Patent number: 4972258
    Abstract: A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material.
    Type: Grant
    Filed: July 31, 1989
    Date of Patent: November 20, 1990
    Assignee: E. I. Du Pont de Nemours and Company
    Inventors: William E. Wolf, Alfred Hirschle, Derrick P. Lattibeaudiere, Robert H. Livermore, Alan P. Stamford, John Taylor