Patents by Inventor Alfred Peer

Alfred Peer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for determining the condition of a measuring probe
    Patent number: 7290434
    Abstract: An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: November 6, 2007
    Assignee: Mettler-Toledo AG
    Inventors: Jürgen Ammann, Alfred Peer, René Oberlin, Klaus-Dieter Anders, Christian Zwicky
  • Method and device for determining the condition of a measuring probe
    Publication number: 20050166660
    Abstract: An exemplary method is disclosed which serves to determine a condition of at least one measuring probe which is integrated in a process vessel of a process system with one or more system stages and which is cleaned from time to time using, for example, CIP- and SIP processes, without uninstalling the measuring probe for the cleaning. The temperature of the measuring probe or of the medium surrounding the measuring probe can be measured by a measuring sensor arranged inside or outside the measuring probe, and the condition of the measuring probe can be determined based on a record of the temperature (TS/M) measured over the time when the measuring probe is in operation. In some cases, the method can include monitoring correct execution of the CIP- and SIP processes.
    Type: Application
    Filed: December 22, 2004
    Publication date: August 4, 2005
    Inventors: Jurgen Ammann, Alfred Peer, Rene Oberlin, Klaus-Dieter Anders, Christian Zwicky