Abstract: A system for sampling and analysis of the chemical composition of any material from any surface is provided. The system comprises of a sniffing line to collect a specimen from a surface for evaluation and a thermal desorption system to thermally desorb an analyte from the sampled material, The system may further comprise of an ionization system to form an ionized analyte. A mass spectrometer is then used to analyze the chemical composition of the ionized analyte sample.

Abstract: A surface interaction sample introduction (SISI) system for mass spectrometers is disclosed that improves sensitivity and reduces chemical background. SISI comprises of a settling chamber with an inlet orifice that ions created by an ionization source enter the MS impinging surface that is located in front of the inlet orifice, thereby the high-speed gas jet entering the settling chamber from the inlet orifice impinges on the impinging surface resealing ions and molecules into the settling chamber. The impinging surface can be one of the settling chamber surfaces or an extra surface placed inside the settling chamber. The impinging surface can be orthogonal or angled with respect to the gas jet. The impinging surface is heated to apply thermal energy to the jet to promote the liberation of ionized particles from attached impurities. The released ions and molecules leave the settling chamber from an outlet port towards a mass spectrometer inlet.

Abstract: A surface interaction sample introduction (SISI) system for mass spectrometers is disclosed that improves sensitivity and reduces chemical background. SISI comprises of a settling chamber with an inlet orifice that ions created by an ionization source enter the MS impinging surface that is located in front of the inlet orifice, thereby the high-speed gas jet entering the settling chamber from the inlet orifice impinges on the impinging surface resealing ions and molecules into the settling chamber. The impinging surface can be one of the settling chamber surfaces or an extra surface placed inside the settling chamber. The impinging surface can be orthogonal or angled with respect to the gas jet. The impinging surface is heated to apply thermal energy to the jet to promote the liberation of ionized particles from attached impurities. The released ions and molecules leave the settling chamber from an outlet port towards a mass spectrometer inlet.

Abstract: A system for sampling and analysis of the chemical composition of any material from any surface is provided. The system comprises of a sniffing line to collect a specimen from a surface for evaluation and a thermal desorption system to thermally desorb an analyte from the sampled material, The system may further comprise of an ionization system to form an ionized analyte. A mass spectrometer is then used to analyze the chemical composition of the ionized analyte sample.