Patents by Inventor Alin Murarasu

Alin Murarasu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11131606
    Abstract: Provided is a method for providing measured values of a technical installation in which measured values in at least one measurement series are captured, wherein a respective measured value is provided by a measurement sensor for a respective physical measurement variable in the technical installation for a respective measurement time. The measured values are categorized as normal measured values or anomalous measured values with the aid of a threshold value comparison and at least one further method stage. The further method stage comprises calculating one or more statistical position parameters for selected measured values from the same measurement series and/or different measurement series. The method makes it possible to increase the reliability of the measured values provided. A technical system comprising the technical installation, at least one measurement sensor and a program-controlled device, and a method for operating the technical system are also proposed.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: September 28, 2021
    Inventors: Giuseppe Fabio Ceschini, Alexey Fishkin, Thomas Hubauer, Alin Murarasu, Mikhail Roshchin, Nicoló Gatta, Mauro Venturini
  • Publication number: 20200249126
    Abstract: Provided is a method for providing measured values of a technical installation in which measured values in at least one measurement series are captured, wherein a respective measured value is provided by a measurement sensor for a respective physical measurement variable in the technical installation for a respective measurement time. The measured values are categorized as normal measured values or anomalous measured values with the aid of a threshold value comparison and at least one further method stage. The further method stage comprises calculating one or more statistical position parameters for selected measured values from the same measurement series and/or different measurement series. The method makes it possible to increase the reliability of the measured values provided. A technical system comprising the technical installation, at least one measurement sensor and a program-controlled device, and a method for operating the technical system are also proposed.
    Type: Application
    Filed: January 30, 2018
    Publication date: August 6, 2020
    Inventors: Giuseppe Fabio Ceschini, Alexey Fishkin, Thomas Hubauer, Alin Murarasu, Mikhail Roshchin, Nicol? Gatta, Mauro Venturini